Fault Diagnosis Of Analog Integrated Circuits
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| Author | : Prithviraj Kabisatpathy |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 183 |
| Release | : 2006-01-13 |
| Genre | : Technology & Engineering |
| ISBN | : 0387257438 |
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
| Author | : Ruey-wen Liu |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 290 |
| Release | : 2012-12-06 |
| Genre | : Computers |
| ISBN | : 1461597471 |
IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
| Author | : Yichuang Sun |
| Publisher | : IET |
| Total Pages | : 411 |
| Release | : 2008-05-30 |
| Genre | : Technology & Engineering |
| ISBN | : 0863417450 |
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
| Author | : M. Bushnell |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 690 |
| Release | : 2006-04-11 |
| Genre | : Technology & Engineering |
| ISBN | : 0306470403 |
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
| Author | : Mark (Mohammad) Tehranipoor |
| Publisher | : Springer |
| Total Pages | : 282 |
| Release | : 2015-02-12 |
| Genre | : Technology & Engineering |
| ISBN | : 3319118242 |
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.
| Author | : Lawrence C. Wagner |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 256 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1461549191 |
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
| Author | : Liang Yan |
| Publisher | : Springer Nature |
| Total Pages | : 7455 |
| Release | : 2023-02-10 |
| Genre | : Technology & Engineering |
| ISBN | : 9811966133 |
This book features the latest theoretical results and techniques in the field of guidance, navigation, and control (GNC) of vehicles and aircrafts. It covers a wide range of topics, including but not limited to, intelligent computing communication and control; new methods of navigation, estimation and tracking; control of multiple moving objects; manned and autonomous unmanned systems; guidance, navigation and control of miniature aircraft; and sensor systems for guidance, navigation and control etc. Presenting recent advances in the form of illustrations, tables, and text, it also provides detailed information of a number of the studies, to offer readers insights for their own research. In addition, the book addresses fundamental concepts and studies in the development of GNC, making it a valuable resource for both beginners and researchers wanting to further their understanding of guidance, navigation, and control.
| Author | : Derong Liu |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 1238 |
| Release | : 2007-05-24 |
| Genre | : Computers |
| ISBN | : 3540723943 |
Annotation The three volume set LNCS 4491/4492/4493 constitutes the refereed proceedings of the 4th International Symposium on Neural Networks, ISNN 2007, held in Nanjing, China in June 2007. The 262 revised long papers and 192 revised short papers presented were carefully reviewed and selected from a total of 1.975 submissions. The papers are organized in topical sections on neural fuzzy control, neural networks for control applications, adaptive dynamic programming and reinforcement learning, neural networks for nonlinear systems modeling, robotics, stability analysis of neural networks, learning and approximation, data mining and feature extraction, chaos and synchronization, neural fuzzy systems, training and learning algorithms for neural networks, neural network structures, neural networks for pattern recognition, SOMs, ICA/PCA, biomedical applications, feedforward neural networks, recurrent neural networks, neural networks for optimization, support vector machines, fault diagnosis/detection, communications and signal processing, image/video processing, and applications of neural networks.
| Author | : Fuliang Yin |
| Publisher | : Springer |
| Total Pages | : 1054 |
| Release | : 2011-04-07 |
| Genre | : Computers |
| ISBN | : 3540286489 |
This book constitutes the proceedings of the International Symposium on Neural N- works (ISNN 2004) held in Dalian, Liaoning, China duringAugust 19–21, 2004. ISNN 2004 received over 800 submissions from authors in ?ve continents (Asia, Europe, North America, South America, and Oceania), and 23 countries and regions (mainland China, Hong Kong, Taiwan, South Korea, Japan, Singapore, India, Iran, Israel, Turkey, Hungary, Poland, Germany, France, Belgium, Spain, UK, USA, Canada, Mexico, - nezuela, Chile, andAustralia). Based on reviews, the Program Committee selected 329 high-quality papers for presentation at ISNN 2004 and publication in the proceedings. The papers are organized into many topical sections under 11 major categories (theo- tical analysis; learning and optimization; support vector machines; blind source sepa- tion,independentcomponentanalysis,andprincipalcomponentanalysis;clusteringand classi?cation; robotics and control; telecommunications; signal, image and time series processing; detection, diagnostics, and computer security; biomedical applications; and other applications) covering the whole spectrum of the recent neural network research and development. In addition to the numerous contributed papers, ?ve distinguished scholars were invited to give plenary speeches at ISNN 2004. ISNN 2004 was an inaugural event. It brought together a few hundred researchers, educators,scientists,andpractitionerstothebeautifulcoastalcityDalianinnortheastern China. It provided an international forum for the participants to present new results, to discuss the state of the art, and to exchange information on emerging areas and future trends of neural network research. It also created a nice opportunity for the participants to meet colleagues and make friends who share similar research interests.
| Author | : Wen Yu |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 1278 |
| Release | : 2009-05-08 |
| Genre | : Computers |
| ISBN | : 3642015123 |
The three volume set LNCS 5551/5552/5553 constitutes the refereed proceedings of the 6th International Symposium on Neural Networks, ISNN 2009, held in Wuhan, China in May 2009. The 409 revised papers presented were carefully reviewed and selected from a total of 1.235 submissions. The papers are organized in 20 topical sections on theoretical analysis, stability, time-delay neural networks, machine learning, neural modeling, decision making systems, fuzzy systems and fuzzy neural networks, support vector machines and kernel methods, genetic algorithms, clustering and classification, pattern recognition, intelligent control, optimization, robotics, image processing, signal processing, biomedical applications, fault diagnosis, telecommunication, sensor network and transportation systems, as well as applications.
