Fault Diagnosis Of Analog Circuits And Systems Via Neural Networks
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Author | : Prithviraj Kabisatpathy |
Publisher | : Springer Science & Business Media |
Total Pages | : 183 |
Release | : 2006-01-13 |
Genre | : Technology & Engineering |
ISBN | : 0387257438 |
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Author | : Luciano Lavagno |
Publisher | : CRC Press |
Total Pages | : 644 |
Release | : 2017-12-19 |
Genre | : Technology & Engineering |
ISBN | : 1482254638 |
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author | : Jiuwen Cao |
Publisher | : Springer |
Total Pages | : 286 |
Release | : 2017-05-25 |
Genre | : Technology & Engineering |
ISBN | : 3319574213 |
This book contains some selected papers from the International Conference on Extreme Learning Machine 2016, which was held in Singapore, December 13-15, 2016. This conference will provide a forum for academics, researchers and engineers to share and exchange R&D experience on both theoretical studies and practical applications of the ELM technique and brain learning. Extreme Learning Machines (ELM) aims to break the barriers between the conventional artificial learning techniques and biological learning mechanism. ELM represents a suite of (machine or possibly biological) learning techniques in which hidden neurons need not be tuned. ELM learning theories show that very effective learning algorithms can be derived based on randomly generated hidden neurons (with almost any nonlinear piecewise activation functions), independent of training data and application environments. Increasingly, evidence from neuroscience suggests that similar principles apply in biological learning systems. ELM theories and algorithms argue that “random hidden neurons” capture an essential aspect of biological learning mechanisms as well as the intuitive sense that the efficiency of biological learning need not rely on computing power of neurons. ELM theories thus hint at possible reasons why the brain is more intelligent and effective than current computers. ELM offers significant advantages over conventional neural network learning algorithms such as fast learning speed, ease of implementation, and minimal need for human intervention. ELM also shows potential as a viable alternative technique for large‐scale computing and artificial intelligence. This book covers theories, algorithms ad applications of ELM. It gives readers a glance of the most recent advances of ELM.
Author | : Yuping Wu |
Publisher | : BoD – Books on Demand |
Total Pages | : 132 |
Release | : 2013-01-09 |
Genre | : Technology & Engineering |
ISBN | : 9535109308 |
The invariable motif for analog design is to explore the new circuit topologies, architectures and CAD technologies to overcome the design challenges coming from the new applications and new fabrication technologies. In this book, a new architecture for a SAR ADC is proposed to eliminate the process mismatches and minimize the errors. A collection of DG-MOSFET based analog/RFICs present the excellent performance; the automated system for a passive filter circuits design is presented with the local searching engaging; interval analysis is used to solve some problems for linear and nonlinear analog circuits and a symbolic method is proposed to solve the testability problem.
Author | : Karsten Keller |
Publisher | : MDPI |
Total Pages | : 260 |
Release | : 2019-12-19 |
Genre | : Science |
ISBN | : 3039280325 |
Entropies and entropy-like quantities play an increasing role in modern non-linear data analysis. Fields that benefit from this application range from biosignal analysis to econophysics and engineering. This issue is a collection of papers touching on different aspects of entropy measures in data analysis, as well as theoretical and computational analyses. The relevant topics include the difficulty to achieve adequate application of entropy measures and the acceptable parameter choices for those entropy measures, entropy-based coupling, and similarity analysis, along with the utilization of entropy measures as features in automatic learning and classification. Various real data applications are given.
Author | : Wen Yu |
Publisher | : Springer |
Total Pages | : 1278 |
Release | : 2009-05-21 |
Genre | : Computers |
ISBN | : 3642015131 |
This book and its companion volumes, LNCS vols. 5551, 5552 and 5553, constitute the proceedings of the 6th International Symposium on Neural Networks (ISNN 2009), held during May 26–29, 2009 in Wuhan, China. Over the past few years, ISNN has matured into a well-established premier international symposium on neural n- works and related fields, with a successful sequence of ISNN symposia held in Dalian (2004), Chongqing (2005), Chengdu (2006), Nanjing (2007), and Beijing (2008). Following the tradition of the ISNN series, ISNN 2009 provided a high-level inter- tional forum for scientists, engineers, and educators to present state-of-the-art research in neural networks and related fields, and also to discuss with international colleagues on the major opportunities and challenges for future neural network research. Over the past decades, the neural network community has witnessed tremendous - forts and developments in all aspects of neural network research, including theoretical foundations, architectures and network organizations, modeling and simulation, - pirical study, as well as a wide range of applications across different domains. The recent developments of science and technology, including neuroscience, computer science, cognitive science, nano-technologies and engineering design, among others, have provided significant new understandings and technological solutions to move the neural network research toward the development of complex, large-scale, and n- worked brain-like intelligent systems. This long-term goal can only be achieved with the continuous efforts of the community to seriously investigate different issues of the neural networks and related fields.
Author | : KAY CHEN TAN |
Publisher | : Springer |
Total Pages | : 767 |
Release | : 2010-06-08 |
Genre | : Computers |
ISBN | : 364213498X |
This book and its companion volume, LNCS vols. 6145 and 6146, constitute the proceedings of the International Conference on Swarm Intelligence (ICSI 2010) held in Beijing, the capital of China, during June 12-15, 2010. ICSI 2010 was the ?rst gathering in the world for researchers working on all aspects of swarm intelligence, and providedan academic forum for the participants to disseminate theirnewresearch?ndingsanddiscussemergingareasofresearch.Italsocreated a stimulating environment for the participants to interact and exchange inf- mation on future challenges and opportunities of swarm intelligence research. ICSI 2010 received 394 submissions from about 1241 authors in 22 countries and regions (Australia, Belgium, Brazil, Canada, China, Cyprus, Hong Kong, Hungary, India, Islamic Republic of Iran, Japan, Jordan, Republic of Korea, Malaysia, Mexico, Norway, Pakistan, South Africa, Chinese Taiwan, UK, USA, Vietnam) across six continents (Asia, Europe, North America, South America, Africa, and Oceania). Each submission was reviewed by at least three reviewers. Based on rigorous reviews by the Program Committee members and reviewers, 185 high-quality papers were selected for publication in the proceedings with the acceptance rate of 46.9%. The papers are organized in 25 cohesive sections covering all major topics of swarm intelligence research and development.
Author | : |
Publisher | : Psychology Press |
Total Pages | : 744 |
Release | : 1993 |
Genre | : Computer science |
ISBN | : 9780805814972 |
Author | : Michael G. Pecht |
Publisher | : John Wiley & Sons |
Total Pages | : 973 |
Release | : 2018-08-21 |
Genre | : Technology & Engineering |
ISBN | : 1119515351 |
An indispensable guide for engineers and data scientists in design, testing, operation, manufacturing, and maintenance A road map to the current challenges and available opportunities for the research and development of Prognostics and Health Management (PHM), this important work covers all areas of electronics and explains how to: assess methods for damage estimation of components and systems due to field loading conditions assess the cost and benefits of prognostic implementations develop novel methods for in situ monitoring of products and systems in actual life-cycle conditions enable condition-based (predictive) maintenance increase system availability through an extension of maintenance cycles and/or timely repair actions; obtain knowledge of load history for future design, qualification, and root cause analysis reduce the occurrence of no fault found (NFF) subtract life-cycle costs of equipment from reduction in inspection costs, downtime, and inventory Prognostics and Health Management of Electronics also explains how to understand statistical techniques and machine learning methods used for diagnostics and prognostics. Using this valuable resource, electrical engineers, data scientists, and design engineers will be able to fully grasp the synergy between IoT, machine learning, and risk assessment.
Author | : |
Publisher | : |
Total Pages | : 442 |
Release | : 2003 |
Genre | : Microelectronics |
ISBN | : |