Fabrication Testing And Reliability Of Semiconductor Lasers Iii
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State-of-the-Art Program on Compound Semiconductors XXXVIII and Wide Bandgap Semiconductors for Photonic and Electronic Devices and Sensors III
Author | : Edward B. Stokes |
Publisher | : The Electrochemical Society |
Total Pages | : 292 |
Release | : 2003 |
Genre | : Technology & Engineering |
ISBN | : 9781566773492 |
Lasers
Author | : Charles Blain |
Publisher | : Nova Publishers |
Total Pages | : 214 |
Release | : 2002 |
Genre | : Technology & Engineering |
ISBN | : 9781590332252 |
Developments in lasers continue to enable progress in many areas such as eye surgery, the recording industry and dozens of others. This book presents citations from the book literature for the last 25 years and groups them for ease of access which is also provided by subject, author and titles indexes.
Reliability of Semiconductor Lasers and Optoelectronic Devices
Author | : Robert Herrick |
Publisher | : Woodhead Publishing |
Total Pages | : 336 |
Release | : 2021-03-06 |
Genre | : Technology & Engineering |
ISBN | : 0128192550 |
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D. - Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry - Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products - Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more
Novel In-plane Semiconductor Lasers III
Author | : Claire F. Gmachl |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 322 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
State-of-the-Art Program on Compound Semiconductors XXXVII (SOTAPOCS XXXVII), and Narrow Bandgap Optoelectronic Materials and Devices
Author | : P. C. Chang |
Publisher | : The Electrochemical Society |
Total Pages | : 344 |
Release | : 2002 |
Genre | : Technology & Engineering |
ISBN | : 9781566773362 |
Semiconductor Laser Engineering, Reliability and Diagnostics
Author | : Peter W. Epperlein |
Publisher | : John Wiley & Sons |
Total Pages | : 522 |
Release | : 2013-01-25 |
Genre | : Technology & Engineering |
ISBN | : 1118481860 |
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Microelectronics Failure Analysis
Author | : EDFAS Desk Reference Committee |
Publisher | : ASM International |
Total Pages | : 673 |
Release | : 2011 |
Genre | : Technology & Engineering |
ISBN | : 1615037268 |
Includes bibliographical references and index.
Current Trends in International Fusion Research
Author | : National Research Council Canada |
Publisher | : NRC Research Press |
Total Pages | : 648 |
Release | : 2002 |
Genre | : Science |
ISBN | : 9780660184807 |