Excess Noise And Its Relationship To Electromigration In Thin Film Interconnections
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Advances in Electronics and Electron Physics
Author | : |
Publisher | : Academic Press |
Total Pages | : 319 |
Release | : 1993-11-17 |
Genre | : Computers |
ISBN | : 0080577539 |
Advances in Electronics and Electron Physics
Noise In Physical Systems And 1/f Fluctuations - Proceedings Of The 13th International Conference
Author | : Vytautas Bareikis |
Publisher | : World Scientific |
Total Pages | : 770 |
Release | : 1995-04-26 |
Genre | : |
ISBN | : 9814549177 |
The volume constitutes the proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF'95) held in Palanga, Lithuania, in the period 29 May - 3 June 1995.International conference of fluctuation phenomena has a rich history. Previous ones were held in St. Louis (USA, 1993), Kyoto (Japan, 1991), Budapest (Hungary, 1989), Montreal (Canada, 1983), etc. The conference proved to be successful in bringing together specialists in fluctuation phenomena in very different areas, and providing a bridge linking theorists and applied scientists involved in the design of new generation of electronic devices. Correspondingly, the volume covers fundamental aspects of noise in various fields of science and modern technology. Mesoscopic fluctuations, noise in high temperature superconductors, in nanoscale structures, in optoelectronic and microwave devices, fluctuation phenomena in biological systems and human body are in the spotlight.
Microstructural Science for Thin Film Metallizations in Electronic Applications
Author | : John Sanchez |
Publisher | : Minerals, Metals, & Materials Society |
Total Pages | : 208 |
Release | : 1988 |
Genre | : Technology & Engineering |
ISBN | : |
The Physical Properties of Thin Metal Films
Author | : G.P. Zhigal'skii |
Publisher | : CRC Press |
Total Pages | : 234 |
Release | : 2003-07-10 |
Genre | : Technology & Engineering |
ISBN | : 9781420024074 |
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Handbook of Semiconductor Interconnection Technology
Author | : Geraldine Cogin Shwartz |
Publisher | : CRC Press |
Total Pages | : 533 |
Release | : 2006-02-22 |
Genre | : Technology & Engineering |
ISBN | : 1420017659 |
First introduced about a decade ago, the first edition of the Handbook of Semiconductor Interconnection Technology became widely popular for its thorough, integrated treatment of interconnect technologies and its forward-looking perspective. The field has grown tremendously in the interim and many of the "likely directions" outlined in the first ed