European Powder Diffraction 6
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Author | : R. Delhez |
Publisher | : Trans Tech Publications Ltd |
Total Pages | : 1232 |
Release | : 2000-01-05 |
Genre | : Technology & Engineering |
ISBN | : 3035705461 |
Volume is indexed by Thomson Reuters CPCI-S (WoS). The proceedings of the 6th European Conference on Powder iffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). Chapters on Method Development, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction offer new ideas on subjects as Microstructure of Materials, Determination of Crystallographic Structure, Quantitative Phase Analysis, and Texture & Coarse Grains. Developments in analysis using the X-ray lens a bundle of glass capillaries- and single or double X-ray mirrors continue.
Author | : R. Delhez |
Publisher | : |
Total Pages | : 0 |
Release | : 1999-12-31 |
Genre | : Diffraction patterns |
ISBN | : 9780878498475 |
The proceedings of the 6th European Conference on Powder iffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). Chapters on Method Development, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction offer new ideas on subjects as Microstructure of Materials, Determination of Crystallographic Structure, Quantitative Phase Analysis, and Texture & Coarse Grains. Developments in analysis using the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors continue.
Author | : EPDIC-6 Organising Committee |
Publisher | : |
Total Pages | : 410 |
Release | : 1998 |
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Total Pages | : 644 |
Release | : 2000 |
Genre | : Diffraction patterns |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 1232 |
Release | : 2000 |
Genre | : |
ISBN | : |
The proceedings of the 6th European Conference on Powder iffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). Chapters on Method Development, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction offer new ideas on subjects as Microstructure of Materials, Determination of Crystallographic Structure, Quantitative Phase Analysis, and Texture & Coarse Grains. Developments in analysis using the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors continue. The some 130 contributions apply current powder diffraction methods to those materials of interest to scientists and engineers: metals and alloys, inorganics and minerals -including thin layers consisting of these materials-, amorphous materials, polymers and organics. A large fraction of these papers analyse phase transformations and reactions in, or with, materials. Awareness is increasing that it is possible to use one set of well-chosen measurements to obtain quantitative information on various material characteristics that govern material properties. Furthermore, many papers show that the results benefit from additional analysis e.g. by TEM, DSC.
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Total Pages | : 0 |
Release | : 2000 |
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ISBN | : 9780878498482 |
Author | : R. Delhez |
Publisher | : Trans Tech Publications Ltd |
Total Pages | : 1008 |
Release | : 1998-04-21 |
Genre | : Technology & Engineering |
ISBN | : 3035705291 |
Volume is indexed by Thomson Reuters CPCI-S (WoS). The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis. Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.
Author | : R. J. Cernik |
Publisher | : |
Total Pages | : 1004 |
Release | : 1996 |
Genre | : Diffraction patterns |
ISBN | : |
This comprehensive publication presents most recent results, and covers practically all aspects of powder diffraction. Part 1 contains contributions dealing with powder diffraction methods, and the larger second part comprises contributions which deal with the application of powder-diffraction methods to specific problems in the physics and chemistry of solids. 1. Method Development. 2. Instrumental Developments and Measurement Techniques. 3. Software and Databases. 4. Synchrotron Powder Diffraction. 5. Neutron Powder Diffraction. 6. Characterization of Thin Layers. 7. Special Topic: In Situ, Time Resolved Powder Diffraction. 8. Miscellaneous. 9. Materials. 9.1 Thin Layers. 9.2 Amorphous Materials. 9.3 Metals and Alloys. 9.4 Minerals and Inorganics. 9.4.1 Analysis of Structural Changes. 9.4.2 Determination of Crystal Structure. 9.4.3 Various Analyses. 9.5 Organics. 9.6 Ceramic Supercoductors.
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Total Pages | : 410 |
Release | : 1998 |
Genre | : Diffraction patterns |
ISBN | : |
Author | : Y. Andersson |
Publisher | : Trans Tech Publications Ltd |
Total Pages | : 430 |
Release | : 2004-01-15 |
Genre | : Technology & Engineering |
ISBN | : 3035706212 |
Volume is indexed by Thomson Reuters CPCI-S (WoS). X-ray powder diffraction is a long-established and invaluable technique which is widely applied to the characterization of crystalline materials. The method has traditionally been used for phase identification, quantitative analysis and for the determination of structural imperfections. In recent years however, its use has been extended into exciting new areas such as the extraction of three-dimensional microstructural properties.