Emc 2004
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Testing for EMC Compliance
| Author | : Mark I. Montrose |
| Publisher | : John Wiley & Sons |
| Total Pages | : 480 |
| Release | : 2004-07-26 |
| Genre | : Science |
| ISBN | : 0471644684 |
The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. This text tells engineers what to do and how to do it. Only a basic knowledge of math, electronics, and a basic understanding of EMI/EMC are necessary to understand the concepts and circuits described. Once EMC troubleshooting is demystified, readers learn there are quick and simple techniques to solve complicated problems a key aspect of this book. Simple and inexpensive methods to resolve EMI issues are discussed to help generate unique ideas and methods for developing additional diagnostic tools and measurement procedures. An appendix on how to build probes is included. It can be a fun activity, even humorous at times with bizarre techniques (i.e., the sticky finger probe).
EMC for Product Designers
| Author | : Tim Williams |
| Publisher | : Elsevier |
| Total Pages | : 513 |
| Release | : 2011-04-01 |
| Genre | : Science |
| ISBN | : 008046954X |
Widely regarded as the standard text on EMC, Tim Williams' book provides all the key information needed to meet the requirements of the latest EMC Directive. Most importantly, it shows how to incorporate EMC principles into the product design process, avoiding cost and performance penalties, meeting the needs of specific standards and resulting in a better overall product. As well as covering the very latest legal requirements, the fourth edition has been thoroughly updated in line with the latest best practice in EMC compliance and product design. Coverage has been considerably expanded to include the R&TTE and Automotive EMC Directives, as well the military aerospace standards of DEF STAN 59-41 and DO160E. A new chapter on systems EMC is included, while short case studies demonstrate how EMC product design is put into practice. Tim Williams has worked for a variety of companies as an electronic design engineer over the last 25 years. He has monitored the progress of the EMC Directive and its associated standards since it was first made public. He now runs his own consultancy specialising in EMC design and test advice and training. - Includes the compliance procedures of the latest EMC Directive: 2004/108/EC - Short case studies demonstrating how EMC product design is put into practice - Packed full with many new chapters including: The R&TTE Directive and the Automotive EMC Directive looking at compliance aspects of radio and telecom terminal equipment and automotive electronic products; New chapter on military aerospace standards of DEP STAN 59-41 and DO1 60E; New chapter on systems EMC
Power Line Communications
| Author | : Lutz Lampe |
| Publisher | : John Wiley & Sons |
| Total Pages | : 624 |
| Release | : 2016-04-14 |
| Genre | : Technology & Engineering |
| ISBN | : 1118676696 |
This second edition of Power Line Communications will show some adjustments in content including new material on PLC for home and industry, PLC for multimedia, PLC for smart grid and PLC for vehicles. Additional chapters include coverage of Channel Characterization, Electromagnetic Compatibility, Coupling, and Digital Transmission Techniques. This book will provide the reader with a wide coverage of the major developments within the field. With contributions from some of the most active researchers on PLC, the book brings together a wealth of international experts on specific PLC topics.
Electromagnetic Compatibility Engineering
| Author | : Henry W. Ott |
| Publisher | : John Wiley & Sons |
| Total Pages | : 883 |
| Release | : 2011-09-20 |
| Genre | : Technology & Engineering |
| ISBN | : 1118210654 |
Praise for Noise Reduction Techniques IN electronic systems "Henry Ott has literally 'written the book' on the subject of EMC. . . . He not only knows the subject, but has the rare ability to communicate that knowledge to others." —EE Times Electromagnetic Compatibility Engineering is a completely revised, expanded, and updated version of Henry Ott's popular book Noise Reduction Techniques in Electronic Systems. It reflects the most recent developments in the field of electromagnetic compatibility (EMC) and noise reduction¿and their practical applications to the design of analog and digital circuits in computer, home entertainment, medical, telecom, industrial process control, and automotive equipment, as well as military and aerospace systems. While maintaining and updating the core information—such as cabling, grounding, filtering, shielding, digital circuit grounding and layout, and ESD—that made the previous book such a wide success, this new book includes additional coverage of: Equipment/systems grounding Switching power supplies and variable-speed motor drives Digital circuit power distribution and decoupling PCB layout and stack-up Mixed-signal PCB layout RF and transient immunity Power line disturbances Precompliance EMC measurements New appendices on dipole antennae, the theory of partial inductance, and the ten most common EMC problems The concepts presented are applicable to analog and digital circuits operating from below audio frequencies to those in the GHz range. Throughout the book, an emphasis is placed on cost-effective EMC designs, with the amount and complexity of mathematics kept to the strictest minimum. Complemented with over 250 problems with answers, Electromagnetic Compatibility Engineering equips readers with the knowledge needed to design electronic equipment that is compatible with the electromagnetic environment and compliant with national and international EMC regulations. It is an essential resource for practicing engineers who face EMC and regulatory compliance issues and an ideal textbook for EE courses at the advanced undergraduate and graduate levels.
The Mobile Multimedia Business
| Author | : Bernd Eylert |
| Publisher | : John Wiley & Sons |
| Total Pages | : 326 |
| Release | : 2006-02-03 |
| Genre | : Technology & Engineering |
| ISBN | : 0470016523 |
As the wireless world opens up, this book explores the evolving role of multimedia and UMTS technology in the mobile communications sector. The author draws on his extensive experience in the field to provide an approach that will appeal to academia and industry alike, covering hot topics such as regulation and licensing, services and applications, markets, security, devices and terminals and charging schemes. Numerous examples from international sources are used to illustrate the current status of the technology around the globe, examining the implications of its evolution to 4G. Focuses on commercial considerations such as regulation, markets, security and charging issues Provides wide-ranging content on the business issues that are attractive to a non-technical readership Puts 3G and UMTS into context by showing its evolution to its present status as well as giving an outlook on the future of mobile communications Includes state-of-the-art advice on 3G and UMTS architecture and deployment, illustrated with practical examples from around the world This is essential reading for technicians and engineers recruited to develop the UMTS and WLAN networks; employees of operators and manufacturers in the industry, new recruits to regulators, and administrators wishing to gain a background understanding of the business of mobile multimedia.
Durability of Concrete and Cement Composites
| Author | : Chris L. Page |
| Publisher | : Elsevier |
| Total Pages | : 415 |
| Release | : 2007-06-30 |
| Genre | : Technology & Engineering |
| ISBN | : 1845693396 |
Whilst most structures made using concrete and cement-based composites have not shown signs of premature degradation, there have been notable exceptions. In addition, there is increasing pressure for new structures to remain in serviceable condition for long periods with only minimal maintenance before being recycled. All these factors have highlighted the issues of what affects the durability of these materials in different circumstances and how material properties can be measured and improved. Durability of concrete and cement composites summarises key research on these important topics.After an introductory chapter, the book reviews the pore structure and chemistry of cement-based materials, providing the foundation for understanding the particular aspects of degradation which are discussed in the following chapters. These include dimensional stability and cracking processes, chemical and microbiological degradation of concrete, corrosion of reinforcing and prestressing steels, deterioration associated with certain aggregates, effects of frost and problems involving fibre-reinforced and polymer-cement composites.With its distinguished international team of contributors, Durability of concrete and cement composites is a standard reference for all those concerned with improving the service life of structures using these materials. - Analyses a range of materials such as reinforced steel in concrete, pre-stressed concrete and cement composites - Discusses key degradation phenomena such as cracking processes and the impact of cold weather conditions - A standard reference for those concerned with improving the service life of structures using concrete and cement based composites
Handbook of Research on Wireless Security
| Author | : Yan Zhang |
| Publisher | : IGI Global |
| Total Pages | : 860 |
| Release | : 2008-01-01 |
| Genre | : Computers |
| ISBN | : 159904899X |
"This book combines research from esteemed experts on security issues in various wireless communications, recent advances in wireless security, the wireless security model, and future directions in wireless security. As an innovative reference source forstudents, educators, faculty members, researchers, engineers in the field of wireless security, it will make an invaluable addition to any library collection"--Provided by publisher.
EMC for Product Designers
| Author | : Tim Williams |
| Publisher | : Elsevier |
| Total Pages | : 513 |
| Release | : 2001-05-17 |
| Genre | : Technology & Engineering |
| ISBN | : 0080505600 |
Tim Williams has worked for a variety of companies as an electronic design engineer over the last 20 years. He has monitored the progress of the EMC Directive and its associated standards since it was first made public. He is a member of the Institution of Electrical Engineers and now runs his own consultancy, specialising in EMC design and training.*Save money on consultancy bills with this book*Practical guide to implementing EMC within the product design process*The leading professional guide to the EMC Directive -100% up-to-date and reliable
Microscopy of Semiconducting Materials 2007
| Author | : A.G. Cullis |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 504 |
| Release | : 2008-12-02 |
| Genre | : Technology & Engineering |
| ISBN | : 1402086156 |
This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.
