Proceedings ... Annual Meeting, Electron Microscopy Society of America
Author | : Electron Microscopy Society of America. Meeting |
Publisher | : |
Total Pages | : 736 |
Release | : 1972 |
Genre | : Electron microscopes |
ISBN | : |
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Author | : Electron Microscopy Society of America. Meeting |
Publisher | : |
Total Pages | : 736 |
Release | : 1972 |
Genre | : Electron microscopes |
ISBN | : |
Author | : Electron Microscopy Society of America |
Publisher | : |
Total Pages | : 950 |
Release | : 1986 |
Genre | : Electron microscopes |
ISBN | : |
Author | : Electron Microscopy Society of America. Meeting |
Publisher | : |
Total Pages | : 782 |
Release | : 1984 |
Genre | : Electron microscopes |
ISBN | : |
Author | : |
Publisher | : Academic Press |
Total Pages | : 269 |
Release | : 2015-06-09 |
Genre | : Technology & Engineering |
ISBN | : 0128025905 |
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field
Author | : |
Publisher | : Academic Press |
Total Pages | : 919 |
Release | : 1996-08-05 |
Genre | : Science |
ISBN | : 0080577628 |
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Author | : Ray Egerton |
Publisher | : Springer Science & Business Media |
Total Pages | : 224 |
Release | : 2011-02-11 |
Genre | : Technology & Engineering |
ISBN | : 9780387258003 |
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author | : Electron Microscopy Society of America. Anniversary Meeting |
Publisher | : |
Total Pages | : 408 |
Release | : 1967 |
Genre | : Electron microscopes |
ISBN | : |
Author | : Xiao-Feng Zhang |
Publisher | : Springer Science & Business Media |
Total Pages | : 400 |
Release | : 2001-10-18 |
Genre | : Medical |
ISBN | : 9783540676805 |
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Author | : United States. National Bureau of Standards |
Publisher | : |
Total Pages | : 766 |
Release | : 1977 |
Genre | : Government publications |
ISBN | : |