From the imaging and spectroscopy of individual dopant atoms and clusters buried inside a semiconductor host, to the three-dimensional tomography of nanoparticles, virii, and biological structures and the in situ observations of nano-mechanical deformation and electrodeposition, advances in instrumentation and algorithms have dramatically changed the field of electron microscopy. Early results in sub-angstrom resolution and millivolt spectroscopy are now being applied to materials problems, and initiatives in aberration-corrected instruments should make these available to the wider community. This book, first published in 2005, showcases how electron microscopy is applied to materials problems and to encourage ideas from both the solid-state and biological communities. Topics include: atomic and subatomic imaging and spectroscopy; electron energy-loss spectroscopy for sub-nanometer chemical and optical properties; three-dimensional nanoscale characterization; quantitative electron microscopy - holography, dopant profiling and diffraction; imaging individual structures and defects in bio- and nonomaterials and in situ microscopy of deformation and growth (even in liquids).