Electron Microscopy In Materials Science Proceedings Of The International School
Download Electron Microscopy In Materials Science Proceedings Of The International School full books in PDF, epub, and Kindle. Read online free Electron Microscopy In Materials Science Proceedings Of The International School ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
| Author | : P G Merli |
| Publisher | : World Scientific |
| Total Pages | : 698 |
| Release | : 1993-01-08 |
| Genre | : |
| ISBN | : 9814555053 |
This volume contains an updated description of the experimental methods currently used in both Scanning and Transmission Electron Microscopy as well as the principles of electron optics and an outline of the most recent instrumental developments.The authors introduce the fundamental principles at the basis of the different techniques, the approximation used in the development of the theories, their range of validity, while stressing how to get microstructural information relevant in Materials Science.
| Author | : Laura Lazzarini |
| Publisher | : Elsevier Inc. Chapters |
| Total Pages | : 78 |
| Release | : 2013-04-11 |
| Genre | : Science |
| ISBN | : 0128083433 |
| Author | : Giovanni Agostini |
| Publisher | : Newnes |
| Total Pages | : 829 |
| Release | : 2013-04-11 |
| Genre | : Technology & Engineering |
| ISBN | : 044459549X |
Characterization of Semiconductor Heterostructures and Nanostructures is structured so that each chapter is devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices. An additional chapter is devoted to ab initio modeling. The book has two basic aims. The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second to the discussion of the most peculiar and innovative examples. The topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely hot, field of Nanotechnology. Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures Most of the chapters are authored by scientists that are world-wide among the top-ten in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures
| Author | : Peter W. Hawkes |
| Publisher | : Academic Press |
| Total Pages | : 481 |
| Release | : 2002-11-05 |
| Genre | : Technology & Engineering |
| ISBN | : 0080525474 |
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
| Author | : J.M. Zuo |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 374 |
| Release | : 2013-06-29 |
| Genre | : Science |
| ISBN | : 1489923535 |
Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R. H(lJier in 1988, and from a return visit to Trondheim by J. C. H. S. in 1990. We are therefore particularly grateful to Professor H(lJier and his students and co-workers for their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O'Keeffe for his encouragement. The depth of his under standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable sounding board for ideas, and was responsible for much of the experimental and theoretical work on coherent nanodiffraction. The sections on this topic derive mainly from collaborations by J. C. H. S. with him in the seventies.
| Author | : U Valdre |
| Publisher | : Elsevier |
| Total Pages | : 785 |
| Release | : 2012-12-02 |
| Genre | : Science |
| ISBN | : 0323142567 |
Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.
| Author | : |
| Publisher | : Academic Press |
| Total Pages | : 919 |
| Release | : 1996-08-05 |
| Genre | : Science |
| ISBN | : 0080577628 |
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
| Author | : |
| Publisher | : |
| Total Pages | : 980 |
| Release | : 1993 |
| Genre | : Conference proceedings |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : 658 |
| Release | : 1976 |
| Genre | : Nuclear energy |
| ISBN | : |
| Author | : N. H. Tolk |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 278 |
| Release | : 2013-03-08 |
| Genre | : Technology & Engineering |
| ISBN | : 3642455506 |
The Workshop on Desorption Induced by Electronic Transitions (DIET) took place May 12-14, 1982, in Williamsburg, Virginia. The meeting brought together, for the first time, most of the leading workers in the fields of electron and photon stimulated desorption from surfaces, as well as many workers in related fields, including sputtering, gas-phase photodissociation and solid-state theory. The emphasis of the workshop was on the microscopic mechanism of stimu lated desorption. Many possible mechanisms have been proposed, and a few new ones emerged at the meeting. Though no consensus was reached, many views were espoused and criticized, frequently with considerable enthusiasm. The result was an appraisal of our current understanding of DIET, and a focus on the experimental and theoretical efforts most likely to lead to new insights. This volume is an attempt to record the information exchanged in this very successful workshop and, perhaps, convey some of the excitement of the field of DIET. The book is a collection of papers written by participants in the DIET workshop, including in addition a contribution from Dietrich Menzel, who was unable to attend. Thus, this book represents a complete statement of the state of the art of experimental and theoretical studies of DIET and related phenomena. More importantly, it addresses the interesting unsolved problems, and suggests strategies for unraveling them. We acknowledge the assistance given by the other members of the organizing committee, A. E. de Vries, R. Gomer, M. L. Knotek, D. Menzel and D. P.
