Electron Diffraction in the Transmission Electron Microscope

Electron Diffraction in the Transmission Electron Microscope
Author: P.E. Champness
Publisher: Garland Science
Total Pages: 223
Release: 2020-08-13
Genre: Science
ISBN: 100014464X

This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached.

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Author: Zhong-lin Wang
Publisher: Springer Science & Business Media
Total Pages: 461
Release: 2013-06-29
Genre: Science
ISBN: 1489915796

Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.

Electron Microscopy and Analysis, Third Edition

Electron Microscopy and Analysis, Third Edition
Author: Peter J. Goodhew
Publisher: CRC Press
Total Pages: 274
Release: 2000-11-30
Genre: Technology & Engineering
ISBN: 9780748409686

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Topics in Electron Diffraction and Microscopy of Materials

Topics in Electron Diffraction and Microscopy of Materials
Author: Peter. B Hirsch
Publisher: CRC Press
Total Pages: 240
Release: 1999-01-01
Genre: Science
ISBN: 9780750305389

Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

Transmission Electron Microscopy

Transmission Electron Microscopy
Author: C. Barry Carter
Publisher: Springer
Total Pages: 543
Release: 2016-08-24
Genre: Technology & Engineering
ISBN: 3319266519

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials
Author: Brent Fultz
Publisher: Springer Science & Business Media
Total Pages: 775
Release: 2012-10-14
Genre: Science
ISBN: 3642297609

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Electron Microscopy And Analysis

Electron Microscopy And Analysis
Author: Peter J. Goodhew
Publisher: CRC Press
Total Pages: 248
Release: 1988-04-25
Genre: Science
ISBN: 9780850664140

A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.

Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy
Author: Ray Egerton
Publisher: Springer Science & Business Media
Total Pages: 224
Release: 2011-02-11
Genre: Technology & Engineering
ISBN: 9780387258003

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Electron Crystallography

Electron Crystallography
Author: D. Dorset
Publisher: Springer Science & Business Media
Total Pages: 447
Release: 2013-04-17
Genre: Science
ISBN: 9401589712

The re-emergent field of quantitative electron crystallography is described by some of its most eminent practitioners. They describe the theoretical framework for electron scattering, specimen preparation, experimental techniques for optimum data collection, the methodology of structure analysis and refinement, and a range of applications to inorganic materials (including minerals), linear polymers, small organic molecules (including those used in nonlinear optical devices), incommensurately modulated structures (including superconductors), alloys, and integral membrane proteins. The connection between electron crystallography and X-ray crystallography is clearly defined, especially in the utilisation of the latest methods for direct determination of crystallographic phases, as well as the unique role of image analysis of high-resolution electron micrographs for phase determination. Even the aspect of multiple beam dynamic diffraction (once dreaded because it was thought to preclude ab initio analysis) is considered as a beneficial aid for symmetry determination as well as the elucidation of crystallographic phases, and as a criterion for monitoring the progress of structure refinement. Whereas other texts have hitherto preferentially dealt with the analysis of electron diffraction and image data from thin organic materials, this work discusses - with considerable optimism - the prospects of looking at `harder' materials, composed of heavier atoms. Audience: Could be used with profit as a graduate-level course on electron crystallography. Researchers in the area will find a statement of current progress in the field.