Electron Beam Sources And Charged Particle Optics
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Author | : Jon Orloff |
Publisher | : CRC Press |
Total Pages | : 666 |
Release | : 2017-12-19 |
Genre | : Science |
ISBN | : 1420045555 |
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Author | : Helmut Liebl |
Publisher | : Springer Science & Business Media |
Total Pages | : 131 |
Release | : 2008-01-12 |
Genre | : Science |
ISBN | : 3540719253 |
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Author | : Harald H. Rose |
Publisher | : Springer Science & Business Media |
Total Pages | : 422 |
Release | : 2009 |
Genre | : Science |
ISBN | : 3540859152 |
This resource covering all theoretical aspects of modern geometrical charged-particle optics is aimed at anyone involved in the design of electron optical instruments and beam-guiding systems for charged particles.
Author | : Timothy R. Groves |
Publisher | : CRC Press |
Total Pages | : 369 |
Release | : 2017-12-19 |
Genre | : Science |
ISBN | : 1482229951 |
Charged Particle Optics Theory: An Introduction identifies the most important concepts of charged particle optics theory, and derives each mathematically from the first principles of physics. Assuming an advanced undergraduate-level understanding of calculus, this book follows a logical progression, with each concept building upon the preceding one. Beginning with a non-mathematical survey of the optical nature of a charged particle beam, the text: Discusses both geometrical and wave optics, as well as the correspondence between them Describes the two-body scattering problem, which is essential to the interaction of a fast charged particle with matter Introduces electron emission as a practical consequence of quantum mechanics Addresses the Fourier transform and the linear second-order differential equation Includes problems to amplify and fill in the theoretical details, with solutions presented separately Charged Particle Optics Theory: An Introduction makes an ideal textbook as well as a convenient reference on the theoretical origins of the optics of charged particle beams. It is intended to prepare the reader to understand the large body of published research in this mature field, with the end result translated immediately to practical application.
Author | : Martin Reiser |
Publisher | : John Wiley & Sons |
Total Pages | : 634 |
Release | : 2008-09-26 |
Genre | : Science |
ISBN | : 3527617639 |
Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such as low-energy focusing and transport systems and high-power microwave sources. Develops material from first principles, basic equations and theorems in a systematic way. Assumptions and approximations are clearly indicated. Discusses underlying physics and validity of theoretical relationships, design formulas and scaling laws. Features a significant amount of recent work including image effects and the Boltzmann line charge density profiles in bunched beams.
Author | : Ramaswamy Jagannathan |
Publisher | : CRC Press |
Total Pages | : 373 |
Release | : 2019-05-20 |
Genre | : Science |
ISBN | : 1351868284 |
Classical Charged Particle Beam Optics used in the design and operation of all present-day charged particle beam devices, from low energy electron microscopes to high energy particle accelerators, is entirely based on classical mechanics. A question of curiosity is: How is classical charged particle beam optics so successful in practice though the particles of the beam, like electrons, are quantum mechanical? Quantum Mechanics of Charged Particle Beam Optics answers this question with a comprehensive formulation of ‘Quantum Charged Particle Beam Optics’ applicable to any charged particle beam device.
Author | : Stanley Humphries, JR. |
Publisher | : Courier Corporation |
Total Pages | : 866 |
Release | : 2013-04-04 |
Genre | : Science |
ISBN | : 0486498689 |
Detailed enough to serve as both text and reference, this volume addresses topics vital to understanding high-power accelerators and high-brightness-charged particle beams, including stochastic cooling, high-brightness injectors, and the free electron laser. 1990 edition.
Author | : |
Publisher | : |
Total Pages | : 870 |
Release | : 2002 |
Genre | : Patents |
ISBN | : |
Author | : Martin Reiser |
Publisher | : John Wiley & Sons |
Total Pages | : 674 |
Release | : 2008-06-25 |
Genre | : Science |
ISBN | : 3527622055 |
This indispensable work offers a broad synoptic description of beams, applicable to a wide range of other devices, such as low-energy focusing and transport systems and high-power microwave sources. The monograph develops the material from the basic principles in a systematic way and discusses the underlying physics and validity of theoretical relationships, design formulas and scaling laws. Assumptions and approximations are clearly indicated throughout. This new, revised and updated edition has 10% additional content, and features, among others, a new chapter on beam physics research from 1993 to 2007, significant enhancement of chapter 6 on emittance variation, updated references and color image plates.
Author | : Jon Orloff |
Publisher | : CRC Press |
Total Pages | : 938 |
Release | : 2017-12-19 |
Genre | : Science |
ISBN | : 1351835777 |
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.