Effects of Radiation on the Electronic Components of a Satellite in Polar Low Earth Orbit

Effects of Radiation on the Electronic Components of a Satellite in Polar Low Earth Orbit
Author: Esther Bermejo Dalmau
Publisher:
Total Pages:
Release: 2012
Genre:
ISBN:

This project aims to analyze space radiation effects on the electronic components of WikiSat, the femto-satellite developed at EETAC. We present a further development of the project presented by Laia Molas Pous, in which radiation effects on electronic components at 28o inclination Low Energy Orbits (LEO) were considered. In this case we study a similar altitude range but focus on polar inclination orbits. This way we expose our model components to a much more hostile radiation space environment. The main tool we use is SPENVIS, the software developed by the European Space Agency (ESA) that allows the computation and analysis of space radiation characteristics and effects on biological and electronic components orbiting around the Earth. Using SPENVIs we define 80o LEO orbits at different altitudes and compute particle fluxes and fluencies, magnitudes that characterize space radiation due to trapped electron and protons, solar particle events and cosmic radiation. SPENVIS also allows us to model the components of the electronic device we intend to study and two different types of battery and the shielding properties of polyethylene and lead. Finally, we analyze the interaction between the radiation environment at the polar LEOs defined above and our model device and batteries. We present the values of total ionizing doses (TID), which characterize an important part of the expected damage on systems exposed to radiation. As expected, the obtained TID values, are above the threshold that would allow a reliable performance of the electronic devices considered. Nevertheless, we show quantitatively that the MEMS with one of the proposed batteries and with the shielding layers of lead or polyethylene accumulate TIDs only about one order of magnitude above the safety threshold of 1 mrad. This result supports the viability of a femto-satellite like WikiSat operating near polar orbits, provided a careful choice of electronic devices more resistant to radiation and the implementation of a basic radiation shield.

Testing at the Speed of Light

Testing at the Speed of Light
Author: National Academies of Sciences, Engineering, and Medicine
Publisher: National Academies Press
Total Pages: 89
Release: 2018-06-08
Genre: Science
ISBN: 030947082X

Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

Analysis of the Radiation Environment Effects on Electronic Components in Near-Earth Orbits

Analysis of the Radiation Environment Effects on Electronic Components in Near-Earth Orbits
Author: L. Varga
Publisher:
Total Pages: 0
Release: 2000
Genre:
ISBN:

The radiation environments at two low altitude orbits have been calculated with the NASA space environment models and codes AP8/AE8, Vette, and CREME. LET spectra and device upset rates for various solar activity scenarios have been determined. Dose deposition into silicon targets as a function of Aluminum shielding thickness has been also calculated with a Monte Carlo code. The results indicate that parameters such as orbit altitude, shielding thickness, and solar activity strongly affect the SEU rates.

Analysis of the Radiation Environment Effects on Electronic Components in Near-earth Orbits

Analysis of the Radiation Environment Effects on Electronic Components in Near-earth Orbits
Author:
Publisher:
Total Pages: 20
Release: 2000
Genre:
ISBN:

This report presents models & calculations of the radiation environment at two low altitude orbits (600 & 1,100 kilometres at inclination angles of 98 and 85 degrees respectively) using the NASA space environment models & codes AP8/AE8, Vette, and CREME. Linear energy transfer spectra and single event upset (SEU) rates for various solar activity scenarios are determined. Dose deposition into silicon targets as a function of Aluminum shielding thickness is been also calculated with a Monte Carlo code. The results indicate how parameters such as orbit altitude, shielding thickness, and solar activity strongly affect the SEU rates.

Radiation Effects on Embedded Systems

Radiation Effects on Embedded Systems
Author: Raoul Velazco
Publisher: Springer Science & Business Media
Total Pages: 273
Release: 2007-06-19
Genre: Technology & Engineering
ISBN: 140205646X

This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.

Mitigation of High Altitude and Low Earth Orbit Radiation Effects on Microelectronics Via Shielding Or Error Detection and Correction Systems

Mitigation of High Altitude and Low Earth Orbit Radiation Effects on Microelectronics Via Shielding Or Error Detection and Correction Systems
Author: National Aeronautics and Space Administration (NASA)
Publisher: Createspace Independent Publishing Platform
Total Pages: 56
Release: 2018-06-03
Genre:
ISBN: 9781720626640

The NASA Cooperative Agreement NAG4-210 was granted under the FY2000 Faculty Awards for Research (FAR) Program. The project was proposed to examine the effects of charged particles and neutrons on selected random access memory (RAM) technologies. The concept of the project was to add to the current knowledge of Single Event Effects (SEE) concerning RAM and explore the impact of selected forms of radiation on Error Detection and Correction Systems. The project was established as an extension of a previous FAR awarded to Prairie View A&M University (PVAMU), under the direction of Dr. Richard Wilkins as principal investigator. The NASA sponsored Center for Applied Radiation Research (CARR) at PVAMU developed an electronic test-bed to explore and quantify SEE on RAM from charged particles and neutrons. The test-bed was developed using 486DX microprocessor technology (PC-104) and a custom test board to mount RAM integrated circuits or other electronic devices. The test-bed had two configurations - a bench test version for laboratory experiments and a 400 Hz powered rack version for flight experiments. The objectives of this project were to: 1) Upgrade the Electronic Test-bed (ETB) to a Pentium configuration; 2) Accommodate more than only 8 Mbytes of RAM; 3) Explore Error Detection and Correction Systems for radiation effects; 4) Test modern RAM technologies in radiation environments.Gupta, Kajal (Technical Monitor) and Kirby, KelvinArmstrong Flight Research CenterSINGLE EVENT UPSETS; RANDOM ACCESS MEMORY; TEST STANDS; RADIATION EFFECTS; ERROR CORRECTING CODES; ERROR DETECTION CODES