Digital Circuit Testing

Digital Circuit Testing
Author: Francis C. Wong
Publisher: Elsevier
Total Pages: 248
Release: 2012-12-02
Genre: Technology & Engineering
ISBN: 0080504345

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

An Introduction to Logic Circuit Testing

An Introduction to Logic Circuit Testing
Author: Parag K. Lala
Publisher: Springer Nature
Total Pages: 99
Release: 2022-06-01
Genre: Technology & Engineering
ISBN: 303179785X

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author: M. Bushnell
Publisher: Springer Science & Business Media
Total Pages: 690
Release: 2006-04-11
Genre: Technology & Engineering
ISBN: 0306470403

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Integrated Circuit Test Engineering

Integrated Circuit Test Engineering
Author: Ian A. Grout
Publisher: Springer Science & Business Media
Total Pages: 396
Release: 2005-08-22
Genre: Technology & Engineering
ISBN: 9781846280238

Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

Random Testing of Digital Circuits

Random Testing of Digital Circuits
Author: Rene David
Publisher: CRC Press
Total Pages: 508
Release: 2020-11-26
Genre: Technology & Engineering
ISBN: 1000146014

"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

Digital Systems Testing and Testable Design

Digital Systems Testing and Testable Design
Author: Miron Abramovici
Publisher: Wiley-IEEE Press
Total Pages: 672
Release: 1994-09-27
Genre: Technology & Engineering
ISBN: 9780780310629

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Practical Digital Logic Design and Testing

Practical Digital Logic Design and Testing
Author: Parag K. Lala
Publisher:
Total Pages: 440
Release: 1996
Genre: Computers
ISBN:

This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.

Digital Circuit Testing and Testability

Digital Circuit Testing and Testability
Author: Parag K. Lala
Publisher: Academic Press
Total Pages: 222
Release: 1997
Genre: Computers
ISBN: 9780124343306

An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.

Digital Integrated Circuits

Digital Integrated Circuits
Author: Evgeni Perelroyzen
Publisher: CRC Press
Total Pages: 320
Release: 2018-10-03
Genre: Computers
ISBN: 142000459X

A current trend in digital design-the integration of the MATLAB® components Simulink® and Stateflow® for model building, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, for better system results. Digital Integrated Circuits: Design-for-Test Using Simulink® and Stateflow® illustrates the construction of Simulink models for digital project test benches in certain design-for-test fields. The first two chapters of the book describe the major tools used for design-for-test. The author explains the process of Simulink model building, presents the main library blocks of Simulink, and examines the development of finite-state machine modeling using Stateflow diagrams. Subsequent chapters provide examples of Simulink modeling and simulation for the latest design-for-test fields, including combinational and sequential circuits, controllability, and observability; deterministic algorithms; digital circuit dynamics; timing verification; built-in self-test (BIST) architecture; scan cell operations; and functional and diagnostic testing. The book also discusses the automatic test pattern generation (ATPG) process, the logical determinant theory, and joint test action group (JTAG) interface models. Digital Integrated Circuits explores the possibilities of MATLAB's tools in the development of application-specific integrated circuit (ASIC) design systems. The book shows how to incorporate Simulink and Stateflow into the process of modern digital design.