Development and Implementation of Acoustic Feedback Control for Scanning Probe Microscopy

Development and Implementation of Acoustic Feedback Control for Scanning Probe Microscopy
Author: Rodolfo Fernández Rodríguez
Publisher:
Total Pages: 102
Release: 2012
Genre: Acoustic imaging
ISBN:

A remote-sensing acoustic method for implementing position control feedback in Scanning Probe Microscopy (SPM) is presented. The capabilities of this feedback control using the new Whispering Gallery Acoustic Sensing (WGAS) method is demonstrated in a Shear-force Scanning Probe Microscope that uses a sharp probe attached to a piezoelectric Quartz Tuning Fork (QTF) firmly mounted on the microscope's frame. As the QTF is electrically driven its mechanical response reaches the SPM frame which then acts as a resonant cavity producing acoustic modes measured with an acoustic sensor strategically placed on the SPM head. The novelty of the WGAS resides in using an SPM frame with a perimeter closely matching the intervening acoustic wavelength to act as a resonant cavity. The whispering gallery cavity constitutes an acoustic amplifier for the mechanical motion of the QTF probe. The observed monotonic behavior of the whispering gallery acoustic signal as a function of the probe sample distance is exploited here for tip-sample distance control with nanometer sensitivity, thus allowing topographic characterization as the probe is scanned across the sample's surface. This thesis includes a description of a Labview based programming for the Field Programmable Gate Array (FPGA) card used in the automated control of the WGAS feedback microscope, a solution for improving the effective resolution of the Digital to Analog Converter (DAC) and initial results towards theoretically modeling the WGAS working principle.

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy
Author: Francesco Marinello
Publisher: Springer Science & Business Media
Total Pages: 513
Release: 2012-10-04
Genre: Science
ISBN: 3642274943

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy
Author: Francesco Marinello
Publisher: Springer Science & Business Media
Total Pages: 513
Release: 2012-10-04
Genre: Technology & Engineering
ISBN: 3642274935

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
Total Pages: 281
Release: 2008-10-22
Genre: Technology & Engineering
ISBN: 3540850376

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Characterization of Condensed Matter

Characterization of Condensed Matter
Author: Yujun Song
Publisher: John Wiley & Sons
Total Pages: 373
Release: 2023-10-23
Genre: Technology & Engineering
ISBN: 3527351094

A comprehensive book that includes essential techniques with their fundamental, instrumentation and application in structural and composition characterization of condensed matter.

Applied Scanning Probe Methods II

Applied Scanning Probe Methods II
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
Total Pages: 472
Release: 2006-02-21
Genre: Technology & Engineering
ISBN: 9783540262428

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Scanning Probe Microscopy of Functional Materials

Scanning Probe Microscopy of Functional Materials
Author: Sergei V. Kalinin
Publisher: Springer Science & Business Media
Total Pages: 563
Release: 2010-12-13
Genre: Technology & Engineering
ISBN: 144197167X

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Design, Modeling and Control of Nanopositioning Systems

Design, Modeling and Control of Nanopositioning Systems
Author: Andrew J. Fleming
Publisher: Springer
Total Pages: 418
Release: 2014-05-15
Genre: Technology & Engineering
ISBN: 331906617X

Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control. Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging. Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.

The Microscope

The Microscope
Author:
Publisher:
Total Pages: 276
Release: 1994
Genre: Crystals
ISBN:

Vol. 3 adds section "The Entomological monthly."