Determining The Uncertainty Of X Ray Absorption Measurements
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Journal of Research of the National Institute of Standards and Technology
| Author | : |
| Publisher | : |
| Total Pages | : 810 |
| Release | : 2002 |
| Genre | : Electronic journals |
| ISBN | : |
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Airport Passenger Screening Using Backscatter X-Ray Machines
| Author | : National Academies of Sciences, Engineering, and Medicine |
| Publisher | : National Academies Press |
| Total Pages | : 203 |
| Release | : 2016-01-10 |
| Genre | : Technology & Engineering |
| ISBN | : 0309371333 |
Passenger screening at commercial airports in the United States has gone through significant changes since the events of September 11, 2001. In response to increased concern over terrorist attacks on aircrafts, the Transportation Security Administration (TSA) has deployed security systems of advanced imaging technology (AIT) to screen passengers at airports. To date (December 2014), TSA has deployed AITs in U.S. airports of two different technologies that use different types of radiation to detect threats: millimeter wave and X-ray backscatter AIT systems. X-ray backscatter AITs were deployed in U.S. airports in 2008 and subsequently removed from all airports by June 2013 due to privacy concerns. TSA is looking to deploy a second-generation X-ray backscatter AIT equipped with privacy software to eliminate production of an image of the person being screened in order to alleviate these concerns. This report reviews previous studies as well as current processes used by the Department of Homeland Security and equipment manufacturers to estimate radiation exposures resulting from backscatter X-ray advanced imaging technology system use in screening air travelers. Airport Passenger Screening Using Backscatter X-Ray Machines examines whether exposures comply with applicable health and safety standards for public and occupational exposures to ionizing radiation and whether system design, operating procedures, and maintenance procedures are appropriate to prevent over exposures of travelers and operators to ionizing radiation. This study aims to address concerns about exposure to radiation from X-ray backscatter AITs raised by Congress, individuals within the scientific community, and others.
EXAFS and Near Edge Structure
| Author | : A. Bianconi |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 430 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 3642500986 |
The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi cult to keep up with the literature. EXAFS and XANES are becoming interdis ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab sorption Fine Structure) and its applications. The other topic of the con ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ ent parts on various types of materials: amorphous metals, glasses, solu tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn chrotron radiation and laboratory EXAFS.
International Tables for Crystallography, Volume I
| Author | : Christopher Chantler |
| Publisher | : John Wiley & Sons |
| Total Pages | : 1090 |
| Release | : 2024-08-19 |
| Genre | : Science |
| ISBN | : 1119433940 |
X-ray absorption spectroscopy and X-ray emission spectroscopy are complementary to crystallographic methods, particularly for materials science and the study of nanostructure and systems with partial disorder and partial local order, including solutions, gases, liquids, glasses and powders. This new volume of International Tables for Crystallography has nine parts and over 150 chapters contributed by a wide range of international experts. Part 1 provides a brief overview and introduction to the background of X-ray absorption spectroscopy (XAS) and experimental facilities. Part 2 discusses the quantum theory of XAS and related approaches. Part 3 describes both standard and advanced experimental methods used in XAS, X-ray emission spectroscopy (XES) and related techniques. Part 4 covers both standard and more advanced pre-processing of data. Part 5 gives an extensive overview of the analysis of experimental data. Part 6 provides details of the major software packages for data collection, reduction and analysis. Part 7 outlines the importance in science, reporting and hypothesis testing of the exchange of input and processed output data, and data deposition. It also presents excerpts of tables of data and supplementary material for XAS, pre-edge studies, X-ray absorption near-edge spectroscopy (XANES) and X-ray absorption fine structure (XAFS) studies. These tables are also available in full as online supporting information. Part 8 explores a wide range of applications of XAS in fields including materials science, physics, chemistry, biology, earth sciences, catalysis and cultural heritage. Part 9 presents definitions of the terms and quantities used, as developed by the International Union of Crystallography's Commission on XAFS. The volume has been written for the worldwide XAS community of thousands of practitioners, beamline scientists, experts and academics, and for the novice user who wishes to know what XAS and XES can do for them and how they may use these techniques for their particular purposes. The volume is therefore intended to be a self-contained, authoritative reference work that can also be used for training, learning or teaching, providing practical guidance for readers of all levels of experience. More information on the volumes in the series International Tables for Crystallography can be found at https://it.iucr.org.
X-Ray Microscopy
| Author | : V. E. Cosslett |
| Publisher | : Cambridge University Press |
| Total Pages | : 455 |
| Release | : 2014-06-12 |
| Genre | : Science |
| ISBN | : 1107654653 |
Originally published in 1960, this book looks at the physical principles behind the use of X-rays for microscopic investigation. Cosslett and Nixon review a variety of techniques used in X-ray microscopy, as well as specimen preparation methods. Many plates of various X-rayed materials are also included.
Scanning Electron Microscopy and X-Ray Microanalysis
| Author | : Joseph Goldstein |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 679 |
| Release | : 2013-11-11 |
| Genre | : Science |
| ISBN | : 1461332737 |
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
