Silicon-On-Insulator (SOI) Technology

Silicon-On-Insulator (SOI) Technology
Author: O. Kononchuk
Publisher: Elsevier
Total Pages: 503
Release: 2014-06-19
Genre: Technology & Engineering
ISBN: 0857099256
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Silicon-On-Insulator (SOI) Technology: Manufacture and Applications covers SOI transistors and circuits, manufacture, and reliability. The book also looks at applications such as memory, power devices, and photonics. The book is divided into two parts; part one covers SOI materials and manufacture, while part two covers SOI devices and applications. The book begins with chapters that introduce techniques for manufacturing SOI wafer technology, the electrical properties of advanced SOI materials, and modeling short-channel SOI semiconductor transistors. Both partially depleted and fully depleted SOI technologies are considered. Chapters 6 and 7 concern junctionless and fin-on-oxide field effect transistors. The challenges of variability and electrostatic discharge in CMOS devices are also addressed. Part two covers recent and established technologies. These include SOI transistors for radio frequency applications, SOI CMOS circuits for ultralow-power applications, and improving device performance by using 3D integration of SOI integrated circuits. Finally, chapters 13 and 14 consider SOI technology for photonic integrated circuits and for micro-electromechanical systems and nano-electromechanical sensors. The extensive coverage provided by Silicon-On-Insulator (SOI) Technology makes the book a central resource for those working in the semiconductor industry, for circuit design engineers, and for academics. It is also important for electrical engineers in the automotive and consumer electronics sectors. - Covers SOI transistors and circuits, as well as manufacturing processes and reliability - Looks at applications such as memory, power devices, and photonics

EDA for IC Implementation, Circuit Design, and Process Technology

EDA for IC Implementation, Circuit Design, and Process Technology
Author: Luciano Lavagno
Publisher: CRC Press
Total Pages: 704
Release: 2018-10-03
Genre: Technology & Engineering
ISBN: 1351837583
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Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The second volume, EDA for IC Implementation, Circuit Design, and Process Technology, thoroughly examines real-time logic to GDSII (a file format used to transfer data of semiconductor physical layout), analog/mixed signal design, physical verification, and technology CAD (TCAD). Chapters contributed by leading experts authoritatively discuss design for manufacturability at the nanoscale, power supply network design and analysis, design modeling, and much more. Save on the complete set.

Reliability, Yield, and Stress Burn-In

Reliability, Yield, and Stress Burn-In
Author: Way Kuo
Publisher: Springer Science & Business Media
Total Pages: 407
Release: 2013-11-27
Genre: Technology & Engineering
ISBN: 1461556716
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The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.

IEEE TENCON 2003

IEEE TENCON 2003
Author:
Publisher: Allied Publishers
Total Pages: 434
Release: 2003
Genre: Artificial intelligence
ISBN: 9780780381629
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Safety, Security, and Reliability of Robotic Systems

Safety, Security, and Reliability of Robotic Systems
Author: Brij B. Gupta
Publisher: CRC Press
Total Pages: 277
Release: 2020-12-30
Genre: Technology & Engineering
ISBN: 1000328058
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With the increasing demand of robots for industrial and domestic use, it becomes indispensable to ensure their safety, security, and reliability. Safety, Security and Reliability of Robotic Systems: Algorithms, Applications, and Technologies provides a broad and comprehensive coverage of the evolution of robotic systems, as well as industrial statistics and future forecasts. First, it analyzes the safety-related parameters of these systems. Then, it covers security attacks and related countermeasures, and how to establish reliability in these systems. The later sections of the book then discuss various applications of these systems in modern industrial and domestic settings. By the end of this book, you will be familiarized with the theoretical frameworks, algorithms, applications, technologies, and empirical research findings on the safety, security, and reliability of robotic systems, while the book’s modular structure and comprehensive material will keep you interested and involved throughout. This book is an essential resource for students, professionals, and entrepreneurs who wish to understand the safe, secure, and reliable use of robotics in real-world applications. It is edited by two specialists in the field, with chapter contributions from an array of experts on robotics systems and applications.

75th Anniversary of the Transistor

75th Anniversary of the Transistor
Author: Arokia Nathan
Publisher: John Wiley & Sons
Total Pages: 469
Release: 2023-07-11
Genre: Technology & Engineering
ISBN: 1394202466
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75th Anniversary of the Transistor 75th anniversary commemorative volume reflecting the transistor's development since inception to current state of the art 75th Anniversary of the Transistor is a commemorative anniversary volume to celebrate the invention of the transistor. The anniversary volume was conceived by the IEEE Electron Devices Society (EDS) to provide comprehensive yet compact coverage of the historical perspectives underlying the invention of the transistor and its subsequent evolution into a multitude of integration and manufacturing technologies and applications. The book reflects the transistor's development since inception to the current state of the art that continues to enable scaling to very large-scale integrated circuits of higher functionality and speed. The stages in this evolution covered are in chronological order to reflect historical developments. Narratives and experiences are provided by a select number of venerated industry and academic leaders, and retired veterans, of the semiconductor industry. 75th Anniversary of the Transistor highlights: Historical perspectives of the state-of-the-art pre-solid-state-transistor world (pre-1947) leading to the invention of the transistor Invention of the bipolar junction transistor (BJT) and analytical formulations by Shockley (1948) and their impact on the semiconductor industry Large scale integration, Moore's Law (1965) and transistor scaling (1974), and MOS/LSI, including flash memories — SRAMs, DRAMs (1963), and the Toshiba NAND flash memory (1989) Image sensors (1986), including charge-coupled devices, and related microsensor applications With comprehensive yet succinct and accessible coverage of one of the cornerstones of modern technology, 75th Anniversary of the Transistor is an essential reference for engineers, researchers, and undergraduate students looking for historical perspective from leaders in the field.