Design For Testability Debug And Reliability
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| Author | : Sebastian Huhn |
| Publisher | : Springer Nature |
| Total Pages | : 164 |
| Release | : 2021-04-19 |
| Genre | : Technology & Engineering |
| ISBN | : 3030692094 |
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
| Author | : Young J. Chiang |
| Publisher | : SAE International |
| Total Pages | : 398 |
| Release | : 2024-09-17 |
| Genre | : Computers |
| ISBN | : 1468607707 |
Failure modes and effects analysis (FMEA); Reliability; Product Development; Design Process; Test Procedures "Explore Product Design and Testing for Automotive Engineering: Volume II, an essential guide reshaping vehicle manufacturing with unprecedented reliability. As part of SAE International’s DOE for Product Reliability Growth series, this practical resource introduces cutting-edge methodologies crucial for predicting and improving product reliability in an era of automotive electrification. The book navigates statistical tolerance design, showcasing how variability in part fabrication and assembly can enhance reliability and sustainability. Key topics include: - Statistical tolerance design's impact on manufacturing and material selection, focusing on non-normal distributions' effects on product assembly and cost. Methods like maximum likelihood estimators and Monte Carlo simulations are used for assembly strategy synthesis. - Reliability DOEs using log-location-scale distributions to estimate lifetimes of non-normally distributed components, especially in accelerated life testing. It covers transformations optimizing parts and system designs under the lognormal distribution. - Weibull distribution (DOE-W) for characterizing lifetimes affected by various failure modes, detailing parameter assessment methods and real-world applications. The book also introduces reliability design of experiments based on the exponential distribution (DOE-E). - Importance of predicting lifecycles and enhancing reliability through qualitative and stepwise accelerated life tests. Integration of physics of failure with statistical methods like Weibull statistics and lognormal approximation enhances analysis credibility. - Inferential mechanisms such as the Arrhenius and Eyring models in predicting automotive component lifecycles, refining product life prediction based on reliability DOEs. Whether you're an engineer, researcher, or automotive professional, this book equips you to navigate reliability engineering confidently. Revolutionize your approach to product design and testing with Product Design and Testing for Automotive Engineering, your definitive companion in shaping the future of automotive reliability." (ISBN 9781468607703 ISBN 9781468607697 ISBN 9781468607727 DOI 10.4271/9781468607697)
| Author | : Young J. Chiang |
| Publisher | : SAE International |
| Total Pages | : 358 |
| Release | : 2023-11-28 |
| Genre | : Computers |
| ISBN | : 1468606026 |
In a world where innovation and sustainability are paramount, Fundamentals of Design of Experiments for Automotive Engineering: Volume I serves as a definitive guide to harnessing the power of statistical thinking in product development. As first of four volumes in SAE International’s DOE for Product Reliability Growth series, this book presents a practical, application-focused approach by emphasizing DOE as a dynamic tool for automotive engineers. It showcases real-world examples, demonstrating how process improvements and system optimizations can significantly enhance product reliability. The author, Yung Chiang, leverages extensive product development expertise to present a comprehensive process that ensures product performance and reliability throughout its entire lifecycle. Whether individuals are involved in research, design, testing, manufacturing, or marketing, this essential reference equips them with the skills needed to excel in their respective roles. This book explores the potential of Reliability and Sustainability with DOE, featuring the following topics: - Fundamental prerequisites for deploying DOE: Product reliability processes, measurement uncertainty, failure analysis, and design for reliability. - Full factorial design 2K: A system identification tool for relating objectives to factors and understanding main and interactive effects. - Fractional factorial design 2RK-P: Ideal for identifying main effects and 2-factor interactions. - General fractional factorial design LK-P: Systematically identification of significant inputs and analysis of nonlinear behaviors. - Composite designs as response surface methods: Resolving interactions and optimizing decisions with limited factors. - Adapting to practical challenges with “short” DOE: Leveraging optimization schemes like D-optimality, and A-optimality for optimal results. Readers are encouraged not to allow product failures to hinder progress but to embrace the "statistical thinking" embedded in DOE. This book can illuminate the path to designing products that stand the test of time, resulting in satisfied customers and thriving businesses. (ISBN 9781468606027, ISBN 9781468606034, ISBN 9781468606041, DOI 10.4271/9781468606034)
| Author | : Sebastian Huhn |
| Publisher | : |
| Total Pages | : 0 |
| Release | : 2021 |
| Genre | : |
| ISBN | : 9783030692100 |
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.
| Author | : Eugene R. Hnatek |
| Publisher | : CRC Press |
| Total Pages | : 472 |
| Release | : 2002-10-25 |
| Genre | : Technology & Engineering |
| ISBN | : 9780203909089 |
Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. He focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.
| Author | : Laung-Terng Wang |
| Publisher | : Elsevier |
| Total Pages | : 809 |
| Release | : 2006-08-14 |
| Genre | : Technology & Engineering |
| ISBN | : 0080474799 |
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
| Author | : Laung-Terng Wang |
| Publisher | : Morgan Kaufmann |
| Total Pages | : 971 |
| Release | : 2009-03-11 |
| Genre | : Technology & Engineering |
| ISBN | : 0080922007 |
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. - Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly - Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence - Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products - Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes
| Author | : Nasib Singh Gill |
| Publisher | : KHANNA PUBLISHING HOUSE |
| Total Pages | : 656 |
| Release | : |
| Genre | : Computers |
| ISBN | : 8190611631 |
Each and every chapter covers the contents up to a reasonable depth necessary for the intended readers in the field. The book consists in all about 1200 exercises based on the topics and sub-topics covered. Keeping in view the emerging trends in newly emerging scenario with new dimension of software engineering, the book specially includes the following chapters, but not limited to these only. This book explains all the notions related to software engineering in a very systematic way, which is of utmost importance to the novice readers in the field of software Engineering.
| Author | : Laung-Terng Wang |
| Publisher | : Morgan Kaufmann |
| Total Pages | : 893 |
| Release | : 2010-07-28 |
| Genre | : Technology & Engineering |
| ISBN | : 0080556809 |
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
| Author | : Ian Grout |
| Publisher | : Elsevier |
| Total Pages | : 763 |
| Release | : 2011-04-08 |
| Genre | : Computers |
| ISBN | : 008055850X |
Digital Systems Design with FPGAs and CPLDs explains how to design and develop digital electronic systems using programmable logic devices (PLDs). Totally practical in nature, the book features numerous (quantify when known) case study designs using a variety of Field Programmable Gate Array (FPGA) and Complex Programmable Logic Devices (CPLD), for a range of applications from control and instrumentation to semiconductor automatic test equipment.Key features include:* Case studies that provide a walk through of the design process, highlighting the trade-offs involved.* Discussion of real world issues such as choice of device, pin-out, power supply, power supply decoupling, signal integrity- for embedding FPGAs within a PCB based design.With this book engineers will be able to:* Use PLD technology to develop digital and mixed signal electronic systems* Develop PLD based designs using both schematic capture and VHDL synthesis techniques* Interface a PLD to digital and mixed-signal systems* Undertake complete design exercises from design concept through to the build and test of PLD based electronic hardwareThis book will be ideal for electronic and computer engineering students taking a practical or Lab based course on digital systems development using PLDs and for engineers in industry looking for concrete advice on developing a digital system using a FPGA or CPLD as its core. - Case studies that provide a walk through of the design process, highlighting the trade-offs involved. - Discussion of real world issues such as choice of device, pin-out, power supply, power supply decoupling, signal integrity- for embedding FPGAs within a PCB based design.
