Defect Recognition And Image Processing In Semiconductors And Devices Proceedings Of The 5th Int Conference 6 10 September 1993 Santander Spain
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Author | : J. Doneker |
Publisher | : Routledge |
Total Pages | : 524 |
Release | : 2017-11-22 |
Genre | : Science |
ISBN | : 1351456474 |
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Author | : Juan Jiménez |
Publisher | : CRC Press |
Total Pages | : 448 |
Release | : 1994-05-26 |
Genre | : Art |
ISBN | : |
The fifth in this series of conferences was held in Santander, Spain from 6 to 10 September 1993, and was attended by workers from industry and research institutes worldwide. Device yield is a crucial factor for determining the choice of semiconducting material made by manufacturers, and that choice is based upon a knowledge of how defects might affect a particular substrate, epilayer or base material. The DRIP conference series was instigated to address the mapping of these technologically important defects. Topics covered at the meeting included silicon, and compound semiconductor substrates and epilayers. Methods for defect recognition included tunelling microscopy, inelastic light scattering (Raman), elastic light scattering, photoluminescence mapping, defect characterization, optical probe beams, and effects of defects on devices. The meeting focused in particular on the microscopic nature of as-grown defects: their distribution as a function of growth conditions, and their redistribution under subsequent heat treatments. The conference dealt with the increasing number and sophistication of visualization techniques which map physical properties of defects, and which may in future permit better control of defect engineering. Researchers in solid state or device physics, or electrical engineering will find this volume an invaluable, up to date reference on the latest techniques for the identification of defects, developments in their control, implications for device fabrication, and future directions for the analysis and mapping of semiconductors.
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Total Pages | : 976 |
Release | : 1994 |
Genre | : Conference proceedings |
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Total Pages | : 2166 |
Release | : 1996 |
Genre | : American literature |
ISBN | : |
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Publisher | : |
Total Pages | : 1084 |
Release | : 1994 |
Genre | : Electrical engineering |
ISBN | : |
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Total Pages | : 2376 |
Release | : 1982 |
Genre | : American literature |
ISBN | : |
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Total Pages | : 2476 |
Release | : 1996 |
Genre | : American literature |
ISBN | : |
Author | : Rose Arny |
Publisher | : |
Total Pages | : 1926 |
Release | : 1994-04 |
Genre | : American literature |
ISBN | : |
Author | : Arthur James Wells |
Publisher | : |
Total Pages | : 2000 |
Release | : 1994 |
Genre | : Bibliography, National |
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Author | : Ovidiu Vermesan |
Publisher | : River Publishers |
Total Pages | : 330 |
Release | : 2015-06-16 |
Genre | : Computers |
ISBN | : 8793237995 |
This book aims to provide a broad overview of various topics of Internet of Things (IoT), ranging from research, innovation and development priorities to enabling technologies, nanoelectronics, cyber-physical systems, architecture, interoperability and industrial applications. All this is happening in a global context, building towards intelligent, interconnected decision making as an essential driver for new growth and co-competition across a wider set of markets. It is intended to be a standalone book in a series that covers the Internet of Things activities of the IERC – Internet of Things European Research Cluster from research to technological innovation, validation and deployment. The book builds on the ideas put forward by the European Research Cluster on the Internet of Things Strategic Research and Innovation Agenda, and presents global views and state of the art results on the challenges facing the research, innovation, development and deployment of IoT in future years. The concept of IoT could disrupt consumer and industrial product markets generating new revenues and serving as a growth driver for semiconductor, networking equipment, and service provider end-markets globally. This will create new application and product end-markets, change the value chain of companies that creates the IoT technology and deploy it in various end sectors, while impacting the business models of semiconductor, software, device, communication and service provider stakeholders. The proliferation of intelligent devices at the edge of the network with the introduction of embedded software and app-driven hardware into manufactured devices, and the ability, through embedded software/hardware developments, to monetize those device functions and features by offering novel solutions, could generate completely new types of revenue streams. Intelligent and IoT devices leverage software, software licensing, entitlement management, and Internet connectivity in ways that address many of the societal challenges that we will face in the next decade.