Defect And Microstructure Analysis By Diffraction
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Author | : Robert L. Snyder |
Publisher | : International Union of Crystal |
Total Pages | : 785 |
Release | : 1999 |
Genre | : Science |
ISBN | : 9780198501893 |
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Author | : Snyder R.L. Et Al |
Publisher | : |
Total Pages | : 0 |
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Author | : Eric J. Mittemeijer |
Publisher | : Springer Science & Business Media |
Total Pages | : 557 |
Release | : 2013-11-21 |
Genre | : Science |
ISBN | : 3662067234 |
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author | : R:FIALA SNYDER (J ET AL.) |
Publisher | : |
Total Pages | : |
Release | : 2000 |
Genre | : |
ISBN | : |
Author | : Eric J. Mittemeijer |
Publisher | : |
Total Pages | : 580 |
Release | : 2014-09-01 |
Genre | : |
ISBN | : 9783662067246 |
Author | : Rozaliya Barabash |
Publisher | : World Scientific |
Total Pages | : 478 |
Release | : 2014 |
Genre | : Science |
ISBN | : 1908979631 |
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author | : B. K. Vainshtein |
Publisher | : Elsevier |
Total Pages | : 431 |
Release | : 2013-10-22 |
Genre | : Science |
ISBN | : 1483164756 |
Structure Analysis by Electron Diffraction focuses on the theory and practice of studying the atomic structure of crystalline substances through electron diffraction. The publication first offers information on diffraction methods in structure analysis and the geometrical theory of electron diffraction patterns. Discussions focus on the fundamental concepts of the theory of scattering and structure analysis of crystals, structure analysis by electron diffraction, formation of spot electron diffraction patterns, electron diffraction texture patterns, and polycrystalline electron diffraction patterns. The text then ponders on intensities of reflections, including atomic scattering, temperature factor, structure amplitude, experimental measurements of intensity, and review of equations for intensities of reflections in electron diffraction patterns. The manuscript examines the Fourier methods in electron diffraction and experimental electron diffraction structure investigations. Topics include the determination of the structure of the hydrated chlorides of transition metals; structures of carbides and nitrides of certain metals and semi-conducting alloys; electron diffraction investigation of clay minerals; and possibilities inherent in structure analysis by electron diffraction. The book is a helpful source of data for readers interested in structure analysis by electron diffraction.
Author | : Rob Phillips |
Publisher | : Cambridge University Press |
Total Pages | : 807 |
Release | : 2001-02-22 |
Genre | : Mathematics |
ISBN | : 0521790050 |
Examines the advances made in the field in recent years and looks at the various methods now used; ideal for graduate students and researchers.
Author | : Gubicza, Jen? |
Publisher | : IGI Global |
Total Pages | : 359 |
Release | : 2014-03-31 |
Genre | : Technology & Engineering |
ISBN | : 1466658533 |
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author | : D. Hull |
Publisher | : Cambridge University Press |
Total Pages | : 334 |
Release | : 1996-08-13 |
Genre | : Technology & Engineering |
ISBN | : 1107393183 |
This edition has been greatly enlarged and updated to provide both scientists and engineers with a clear and comprehensive understanding of composite materials. In describing both theoretical and practical aspects of their production, properties and usage, the book crosses the borders of many disciplines. Topics covered include: fibres, matrices, laminates and interfaces; elastic deformation, stress and strain, strength, fatigue crack propagation and creep resistance; toughness and thermal properties; fatigue and deterioration under environmental conditions; fabrication and applications. Coverage has been increased to include polymeric, metallic and ceramic matrices and reinforcement in the form of long fibres, short fibres and particles. Designed primarily as a teaching text for final-year undergraduates in materials science and engineering, this book will also interest undergraduates and postgraduates in chemistry, physics, and mechanical engineering. In addition, it will be an excellent source book for academic and technological researchers on materials.