Contactless Vlsi Measurement And Testing Techniques
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Author | : Selahattin Sayil |
Publisher | : Springer |
Total Pages | : 92 |
Release | : 2017-11-16 |
Genre | : Technology & Engineering |
ISBN | : 3319696734 |
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.
Author | : Bengt Källbäck |
Publisher | : Springer Science & Business Media |
Total Pages | : 239 |
Release | : 2013-03-08 |
Genre | : Technology & Engineering |
ISBN | : 3642829791 |
In the past, a number of Satellite Conferences have been held in con nection with the International Conference on Physics of Semiconductors, covering selected fields of interest. In 1986, when the main conference was held in Stockholm, Sweden, new. phenomena had to be discussed: super lattices, hot 'electron phenomena and new device structures for high-speed applications. The aim was to select topics which would be of interest to physicists as well as to electronics engineers. Therefore a Satellite Con ference on H!gh-Speed Electronics, Basic Physical Phenomena and Device Principles, was arranged at Saltjobaden, a coastal resort near Stockholm. An organizing committee was established after the first suggestion made by Professor Grimmeiss from the University of Lund, Sweden, and some preliminary discussions on the Conference format. A Program Committee was established to be responsible for the further selection of the invited talks, the regular papers and poster presentation. The aim was to have a broad spectrum of contributions to attract physicists as well as device oriented engineers and to stimulate discussions among the participants. These Proceedings contain all oral and poster presentations, with em phasis on the invited talks, which give a competent overview of the field. The fast publication by Springer-Verlag has permitted the presentation of an up-to-date survey of the principles of high-speed electronics. Incorpo ration in the Springer Series in Electronics and Photonics will enable the book to be distributed worldwide and to reach all interested scientists.
Author | : Mohammad Tehranipoor |
Publisher | : Springer Science & Business Media |
Total Pages | : 411 |
Release | : 2007-12-08 |
Genre | : Technology & Engineering |
ISBN | : 0387747478 |
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Author | : |
Publisher | : |
Total Pages | : 392 |
Release | : 1993 |
Genre | : Application-specific integrated circuits |
ISBN | : |
Author | : |
Publisher | : ASM International |
Total Pages | : 162 |
Release | : 2001-01-01 |
Genre | : Technology & Engineering |
ISBN | : 0871707454 |
Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Author | : |
Publisher | : |
Total Pages | : 822 |
Release | : 1989 |
Genre | : Computer engineering |
ISBN | : |
Author | : |
Publisher | : ASM International |
Total Pages | : 160 |
Release | : 2002-01-01 |
Genre | : Technology & Engineering |
ISBN | : 0871707691 |
Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee
Author | : Golla Eranna |
Publisher | : CRC Press |
Total Pages | : 432 |
Release | : 2014-12-08 |
Genre | : Science |
ISBN | : 1040055850 |
Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is difficult to separate from its chemical compounds because of its reactivity. As a solid, silicon is chemical
Author | : Shojiro Asai |
Publisher | : Springer |
Total Pages | : 792 |
Release | : 2018-07-20 |
Genre | : Technology & Engineering |
ISBN | : 4431565949 |
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Author | : Krzysztof Iniewski |
Publisher | : John Wiley & Sons |
Total Pages | : 632 |
Release | : 2012-04-17 |
Genre | : Technology & Engineering |
ISBN | : 1118181476 |
The book will address the-state-of-the-art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging materials that can take system performance beyond standard CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. Three-dimensional (3-D) CMOS integration and co-integration with sensor technology are described as well. The book is a must for anyone serious about circuit design for future technologies. The book is written by top notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book will be also used as a recommended reading and supplementary material in graduate course curriculum. Intended audience is professionals working in the integrated circuit design field. Their job titles might be : design engineer, product manager, marketing manager, design team leader, etc. The book will be also used by graduate students. Many of the chapter authors are University Professors.