Computer Techniques For Image Processing In Electron Microscopy
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Author | : W. O. Saxton |
Publisher | : Academic Press |
Total Pages | : 302 |
Release | : 2013-11-06 |
Genre | : Science |
ISBN | : 1483284646 |
Computer Techniques for Image Processing in Electron Microscopy: Advances in Electronics and Electron Physics presents the sophisticated computer generated in processing the image. This book discusses the development of fast Fourier transform algorithms, which has led to the possibility of achieving a more reliable interpretation of electron micrographs by digital means. Organized into 10 chapters, this book begins with an overview of image formation in which the properties of the linear approximation are included. This text then reviews the available hardware and the basic mathematical methods of image processing in electron microscopy. Other chapters consider the constraints imposed on the image wave function by the objective lens aperture. This book discusses as well the properties of discrete Fourier transforms. The final chapter deals with a particular processing system called the Improc system. This book is a valuable resource for physicists and researcher workers who are interested in the study of image processing.
Author | : Ludwig Reimer |
Publisher | : Springer Science & Business Media |
Total Pages | : 602 |
Release | : 2008-08-28 |
Genre | : Science |
ISBN | : 0387400931 |
The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
Author | : P. W. Hawkes |
Publisher | : Springer |
Total Pages | : 296 |
Release | : 2011-12-27 |
Genre | : Science |
ISBN | : 9783642813832 |
Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.
Author | : Earl J. Kirkland |
Publisher | : Springer Science & Business Media |
Total Pages | : 289 |
Release | : 2010-08-12 |
Genre | : Science |
ISBN | : 1441965335 |
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.
Author | : P. W. Hawkes |
Publisher | : Springer Science & Business Media |
Total Pages | : 307 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 364281381X |
Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.
Author | : Earl J. Kirkland |
Publisher | : Springer Nature |
Total Pages | : 357 |
Release | : 2020-03-09 |
Genre | : Science |
ISBN | : 3030332608 |
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Author | : P. W. Hawkes |
Publisher | : |
Total Pages | : 416 |
Release | : 1988 |
Genre | : Electron microscopes |
ISBN | : |
Author | : John J. Bozzola |
Publisher | : Jones & Bartlett Learning |
Total Pages | : 702 |
Release | : 1999 |
Genre | : Medical |
ISBN | : 9780763701925 |
New edition of an introductory reference that covers all of the important aspects of electron microscopy from a biological perspective, including theory of scanning and transmission; specimen preparation; darkroom, digital imaging, and image analysis; laboratory safety; interpretation of images; and an atlas of ultrastructure. Generously illustrated with bandw line drawings and photographs. Annotation copyrighted by Book News, Inc., Portland, OR
Author | : |
Publisher | : Academic Press |
Total Pages | : 443 |
Release | : 1988-10-01 |
Genre | : Science |
ISBN | : 0080860494 |
This volume of this acclaimed series deals with electron microscopic techniques applied for the elucidation of microbial structures and structure-function relationships at cellular, sub-cellular, and macromolecular levels. Many of the recent findings on ultrastructural features of microorganisms have been obtained with newly developed methods, though classical approaches have not lost their validity. Therefore, both conventional and new methods have been incorporated into this volume. The topics dealt with are meaningful not only in bacterial cytology but also in physiology, enzymology, biochemistry, and molecular biology, and include aspects of medical and biotechnological application.
Author | : W. Baumeister |
Publisher | : Springer Science & Business Media |
Total Pages | : 365 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 364267688X |
If, ten years ago, one had been asked to comment on the prospects of peering into the fmest details of biomolecular organization, most electron microscopists would, I suppose at least, have been quite en thusiastic. When, during the early seventies, several groups were success ful in visualizing single heavy atoms, which undoubtedly was a techni cal triumph, this prompted the most sanguine expectations among bi ologists. In the following years, however, it began to transpire that radiation damage might impose limitations preventing us from taking full advantage of these exciting instrumental feasibilities. Fortunately, the radiation damage nightmare did no paralyze further activities, and it was in particular the work on the purple membrane which, brilliant ly exploiting the redundancy stratagem, revealed exhilarating new perspectives. Now, almost five years later, it seemed timely and appro priate to organize an international symposium to discuss and weight recent activities and current trends in "molecular microscopy". In planning this symposium, we selected topics according to our view of what is important or will deserve more attention in the near future. Taking into consideration suggestions made by the invited participants, some supplementary aspects were included; as a conse quence, the program developed somewhat beyond the scope as adum brated by the original title of this meeting (Regular 2-D Arrays of Biomacromolecules: Structure Determination and Assembly). As the meeting was organized, we had three morning sessions aimed at reflecting the "State ofthe Art".