Clinical Applications of the Scanning Electron Microscope
| Author | : H. W. Carter |
| Publisher | : Scanning Microscopy International |
| Total Pages | : 40 |
| Release | : 1980 |
| Genre | : Electron microscopy |
| ISBN | : 9780931288166 |
Clinical Applications Of The Scanning Electron Microscope
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Physical Principles of Electron Microscopy
| Author | : Ray Egerton |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 224 |
| Release | : 2011-02-11 |
| Genre | : Technology & Engineering |
| ISBN | : 9780387258003 |
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Scanning Electron Microscopy for the Life Sciences
| Author | : Heide Schatten |
| Publisher | : Cambridge University Press |
| Total Pages | : 275 |
| Release | : 2013 |
| Genre | : Science |
| ISBN | : 0521195993 |
A guide to modern scanning electron microscopy instrumentation, methodology and techniques, highlighting novel applications to cell and molecular biology.
Scanning Electron Microscopy in BIOLOGY
| Author | : R.G. Kessel |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 330 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 3642808344 |
In the continuing quest to explore structure and to relate struc tural organization to functional significance, the scientist has developed a vast array of microscopes. The scanning electron microscope (SEM) represents a recent and important advance in the development of useful tools for investigating the structural organization of matter. Recent progress in both technology and methodology has resulted in numerous biological publications in which the SEM has been utilized exclusively or in connection with other types of microscopes to reveal surface as well as intracellular details in plant and animal tissues and organs. Because of the resolution and depth of focus presented in the SEM photograph when compared, for example, with that in the light microscope photographs, images recorded with the SEM have widely circulated in newspapers, periodicals and scientific journals in recent times. Considering the utility and present status of scanning electron microscopy, it seemed to us to be a particularly appropriate time to assemble a text-atlas dealing with biological applications of scanning electron microscopy so that such information might be presented to the student and to others not yet familiar with its capabilities in teaching and research. The major goal of this book, therefore, has been to assemble material that would be useful to those students beginning their study of botany or zoo logy, as well as to beginning medical students and students in advanced biology courses.
Correlative Light and Electron MIcroscopy
| Author | : Thomas Muller-Reichert |
| Publisher | : Academic Press |
| Total Pages | : 466 |
| Release | : 2012-08-10 |
| Genre | : Science |
| ISBN | : 0124160263 |
The combination of electron microscopy with transmitted light microscopy (termed correlative light and electron microscopy; CLEM) has been employed for decades to generate molecular identification that can be visualized by a dark, electron-dense precipitate. This new volume of Methods in Cell Biology covers many areas of CLEM, including a brief history and overview on CLEM methods, imaging of intermediate stages of meiotic spindle assembly in C. elegans embryos using CLEM, and capturing endocytic segregation events with HPF-CLEM. Covers many areas of CLEM by the best international scientists in the field Includes a brief history and overview on CLEM methods
Biological Field Emission Scanning Electron Microscopy, 2 Volume Set
| Author | : Roland A. Fleck |
| Publisher | : John Wiley & Sons |
| Total Pages | : 741 |
| Release | : 2019-04-29 |
| Genre | : Science |
| ISBN | : 1118654064 |
The go‐to resource for microscopists on biological applications of field emission gun scanning electron microscopy (FEGSEM) The evolution of scanning electron microscopy technologies and capability over the past few years has revolutionized the biological imaging capabilities of the microscope—giving it the capability to examine surface structures of cellular membranes to reveal the organization of individual proteins across a membrane bilayer and the arrangement of cell cytoskeleton at a nm scale. Most notable are their improvements for field emission scanning electron microscopy (FEGSEM), which when combined with cryo-preparation techniques, has provided insight into a wide range of biological questions including the functionality of bacteria and viruses. This full-colour, must-have book for microscopists traces the development of the biological field emission scanning electron microscopy (FEGSEM) and highlights its current value in biological research as well as its future worth. Biological Field Emission Scanning Electron Microscopy highlights the present capability of the technique and informs the wider biological science community of its application in basic biological research. Starting with the theory and history of FEGSEM, the book offers chapters covering: operation (strengths and weakness, sample selection, handling, limitations, and preparation); Commercial developments and principals from the major FEGSEM manufacturers (Thermo Scientific, JEOL, HITACHI, ZEISS, Tescan); technical developments essential to bioFEGSEM; cryobio FEGSEM; cryo-FIB; FEGSEM digital-tomography; array tomography; public health research; mammalian cells and tissues; digital challenges (image collection, storage, and automated data analysis); and more. Examines the creation of the biological field emission gun scanning electron microscopy (FEGSEM) and discusses its benefits to the biological research community and future value Provides insight into the design and development philosophy behind current instrument manufacturers Covers sample handling, applications, and key supporting techniques Focuses on the biological applications of field emission gun scanning electron microscopy (FEGSEM), covering both plant and animal research Presented in full colour An important part of the Wiley-Royal Microscopical Series, Biological Field Emission Scanning Electron Microscopy is an ideal general resource for experienced academic and industrial users of electron microscopy—specifically, those with a need to understand the application, limitations, and strengths of FEGSEM.
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
| Author | : Patrick Echlin |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 329 |
| Release | : 2011-04-14 |
| Genre | : Technology & Engineering |
| ISBN | : 0387857311 |
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Image Formation in Low-voltage Scanning Electron Microscopy
| Author | : Ludwig Reimer |
| Publisher | : SPIE Press |
| Total Pages | : 162 |
| Release | : 1993 |
| Genre | : Science |
| ISBN | : 9780819412065 |
While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.
Scanning Microscopy for Nanotechnology
| Author | : Weilie Zhou |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 533 |
| Release | : 2007-03-09 |
| Genre | : Technology & Engineering |
| ISBN | : 0387396209 |
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Scanning Transmission Electron Microscopy
| Author | : Stephen J. Pennycook |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 764 |
| Release | : 2011-03-24 |
| Genre | : Technology & Engineering |
| ISBN | : 1441972005 |
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
