Characterization Testing Measurement And Metrology
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| Author | : Chander Prakash |
| Publisher | : CRC Press |
| Total Pages | : 205 |
| Release | : 2020-10-25 |
| Genre | : Technology & Engineering |
| ISBN | : 1000193330 |
This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years. The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems. The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.
| Author | : Horst Czichos |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 1244 |
| Release | : 2011-07-22 |
| Genre | : Technology & Engineering |
| ISBN | : 3642166415 |
This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
| Author | : Shri Krishna Kimothi |
| Publisher | : Quality Press |
| Total Pages | : 398 |
| Release | : 2001-11-01 |
| Genre | : Business & Economics |
| ISBN | : 1636941818 |
The uncertainty of measurement results is drawing attention of managers, metrologists and customers. The accuracy of measurements affects all of us in trade, commerce, safety, health care environmental protection and more. The quality of these measurements are regulated by a variety of government agencies. Measurement also plays an important role in manufacturing and service organizations. Use this book to learn more about metrology and the need for reliable measurements. You can also learn about measurement system and quality of measurement systems, objectives and methods. Statistical techniques in metrology are also explained. Examples of measurement data and random variables, probability density functions, sampling distribution, statistical estimation degrees of freedom and regression are included. An entire chapter is devoted to measurement errors. The book goes in-depth into explaining national and international measurement systems and standards, and includes a complete chapter on calibration and measurement trace ability. Measurement Uncertainty will show how to evaluate various uncertainties in measurements using several approaches including international consensus. Calibration laboratories can look specifically at the chapter on that profession to guide them in their measurement improvements. Kimothi also looks at specific industries and their measurement capabilities and includes examples of R&R studies. A great resource for the CQE, CQT, CCT, CSSBB certification exams!
| Author | : Horst Czichos |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 1215 |
| Release | : 2007-04-13 |
| Genre | : Technology & Engineering |
| ISBN | : 3540303006 |
This Handbook compiles advanced methods for materials measurement and characterization from the macroscopic to the nano-scale. Materials professionals need not only handbooks of materials data but clear guidelines and standards for how to measure the full spectrum of materials characteristics of new materials ans systems. Since materials science forms a bridge between the more traditonal fields of physics, engineering, and chemistry, unifying the varying perspectives and covering the full gamut of properties also serves a useful purpose. This handbook is the first dedicated to these practical and important considerations.
| Author | : Luigi Cocco |
| Publisher | : BoD – Books on Demand |
| Total Pages | : 294 |
| Release | : 2016-07-20 |
| Genre | : Technology & Engineering |
| ISBN | : 9535124773 |
Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.
| Author | : Horst Czichos |
| Publisher | : Springer |
| Total Pages | : 214 |
| Release | : 2018-04-12 |
| Genre | : Technology & Engineering |
| ISBN | : 3319763857 |
This book presents the principles, methods and techniques to characterize materials and technical systems. The book is organized with concise text-graphics compilations in three parts: The first part describes the fundamentals of measurement, testing and sensor technology, including a survey of sensor types for dimensional metrology, kinematics, dynamics, and temperature. It describes also microsensors and embedded sensors. The second part gives an overview of materials and explains the application of measurement, testing and sensor technology to characterize composition, microstructure, properties and performance of materials as well as deterioration mechanisms and reliability. The third part introduces the general systems theory for the characterization of technical systems, exemplified by mechatronic and tribological systems. It describes technical diagnostics for structural health monitoring and performance control.
| Author | : Oleh Velychko |
| Publisher | : BoD – Books on Demand |
| Total Pages | : 152 |
| Release | : 2022-05-11 |
| Genre | : Technology & Engineering |
| ISBN | : 1803550481 |
In the modern era of scientific and technological development, the role of measurements and metrology in scientific research is becoming more and more important due to the increase in the testing of various products. Moreover, requirements for the accuracy and reliability of measurement results are increasing significantly and their ranges are expanding. Improving measurement accuracy allows us to identify the shortcomings of certain technological processes and either eliminate them or reduce their influence. This leads to better-quality products and contributes to saving energy and other resources, as well as raw materials and materials. This book discusses relevant aspects of practical metrological activity to establish traceability of measurements while increasing their accuracy and reliability. It also presents procedures for the calibration and testing of measuring instruments.
| Author | : Zhiyong Ma |
| Publisher | : CRC Press |
| Total Pages | : 843 |
| Release | : 2017-03-27 |
| Genre | : Science |
| ISBN | : 135173394X |
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
| Author | : Zhiyong Ma |
| Publisher | : CRC Press |
| Total Pages | : 1454 |
| Release | : 2017-03-27 |
| Genre | : Science |
| ISBN | : 1351733958 |
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
| Author | : Chander Prakash |
| Publisher | : CRC Press |
| Total Pages | : 690 |
| Release | : 2021-01-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1000193209 |
This three-volume set addresses a new knowledge of function materials, their processing, and their characterizations. "Functional and Smart Materials", covered the synthesis and fabrication route of functional and smart materials for universal applications such as material science, mechanical engineering, manufacturing, metrology, nanotechnology, physics, chemical, biology, chemistry, civil engineering, and food science. "Advanced Manufacturing and Processing Technology" covers the advanced manufacturing technologies includes coating, deposition, cladding, nanotechnology, surface finishing, precision machining, processing, and emerging advanced manufacturing technologies for processing of materials for functional applications. "Characterization, Testing, Measurement and Metrology" covered the application of new and advanced characterization techniques to investigate and analysis the processed materials.
