Characterization Of Ultrathin Organic Films At The Air Silver Interface By Infrared Visible Sum Frequency Generation Spectroscopy
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Nonlinear Optics Studies of the Interface of Organic Ultrathin Films
Author | : Xiaojun Cai |
Publisher | : |
Total Pages | : 356 |
Release | : 2011 |
Genre | : Organic thin films |
ISBN | : |
Characterization of Organic Thin Films
Author | : Abraham Ulman |
Publisher | : Butterworth-Heinemann |
Total Pages | : 302 |
Release | : 1995 |
Genre | : Science |
ISBN | : |
Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.
An Introduction to Ultrathin Organic Films
Author | : Abraham Ulman |
Publisher | : Academic Press |
Total Pages | : 468 |
Release | : 2013-10-22 |
Genre | : Science |
ISBN | : 0080926312 |
The development of oriented organic monomolecular layers by the Langmuir-Blodgett (LB) and self-assembly (SA) techniques has led researchers toward their goal of assembling individual molecules into highly ordered architectures. Thus the continually growing contribution of LB and SA systems to the chemistry and physics of thin organic films is widely recognized. Equally well-known is the difficulty in keeping up to date with the burgeoning multidisciplinary research in this area. Dr. Ulman provides a massive survey of the available literature. The book begins with a section on analytical tools to broaden the understanding of the structure and properties of monolayers and films. Following sections discuss LB films, the preparation and properties of SA monolayers and films, the modeling of LB and SA monolayers, and the application of LB and SA films.
In Situ Real-Time Characterization of Thin Films
Author | : Orlando Auciello |
Publisher | : John Wiley & Sons |
Total Pages | : 282 |
Release | : 2001 |
Genre | : Science |
ISBN | : 9780471241416 |
An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Optical Characterization of Thin Solid Films
Author | : Olaf Stenzel |
Publisher | : Springer |
Total Pages | : 474 |
Release | : 2018-03-09 |
Genre | : Science |
ISBN | : 3319753258 |
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Interface Controlled Organic Thin Films
Author | : Horst-Günter Rubahn |
Publisher | : Springer Science & Business Media |
Total Pages | : 208 |
Release | : 2009-06-12 |
Genre | : Technology & Engineering |
ISBN | : 3540959300 |
Organic semiconductors are a central topic of advanced materials research. The book is aiming at bridging the gap between the development and production of devices and basic research on thin film characterisation using cutting-edge techniques in surface and interface science. Topics involve organic molecular-based sensors; interfaces in organic diodes and transistors; mobility in organic field effect transistors and space charge problems; integration of optoelectronic nanostructures; nonlinear optical properties of organic nanostructures; the wetting layer problem; how to get from functionalized molecules to nanoaggregates; optical, electrical and mechanical properties of organic nanofibers as well; as near field investigations of organic thin films.