Atomic Force Microscopy For Energy Research
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| Author | : Cai Shen |
| Publisher | : CRC Press |
| Total Pages | : 457 |
| Release | : 2022-04-26 |
| Genre | : Science |
| ISBN | : 1000577872 |
Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM tools Enables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.
| Author | : Dawn A. Bonnell |
| Publisher | : World Scientific |
| Total Pages | : 640 |
| Release | : 2013 |
| Genre | : Technology & Engineering |
| ISBN | : 981443471X |
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
| Author | : Dawn Bonnell |
| Publisher | : World Scientific |
| Total Pages | : 640 |
| Release | : 2013-03-26 |
| Genre | : Science |
| ISBN | : 9814434728 |
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
| Author | : Greg Haugstad |
| Publisher | : John Wiley & Sons |
| Total Pages | : 496 |
| Release | : 2012-09-04 |
| Genre | : Science |
| ISBN | : 1118360680 |
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”
| Author | : Bert Voigtländer |
| Publisher | : Springer |
| Total Pages | : 331 |
| Release | : 2019-05-23 |
| Genre | : Science |
| ISBN | : 303013654X |
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
| Author | : Ronald G Reifenberger |
| Publisher | : World Scientific |
| Total Pages | : 341 |
| Release | : 2015-09-29 |
| Genre | : Science |
| ISBN | : 9814630373 |
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
| Author | : M.T. Bray |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 431 |
| Release | : 2013-11-11 |
| Genre | : Technology & Engineering |
| ISBN | : 1475793227 |
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
| Author | : Jian Zhong |
| Publisher | : Academic Press |
| Total Pages | : 385 |
| Release | : 2022-09-29 |
| Genre | : Technology & Engineering |
| ISBN | : 0128241322 |
Fundamentals and Application of Atomic Force Microscopy for Food Research explains how to get reliable AFM data and current application progress of AFM in different food substances. Sections focus on an Introduction to AFM for food research and Applications of AFM for different types of food substances. Edited by 3 experts in the field of nanotechnology and food science, this book reduces the difficulty of AFM application and shortens the learning time for new hands. Until now, no such book has systematically described the application of Atomic Force Microscopy (AFM) for food research. Many scientists in the field of food science and engineering need to evaluate their developed foods and food contact surfaces at nanoscale. However, there is a steep learning curve for new hands, hence the need for this comprehensive resource. Describes the application of AFM for food research Covers applications of AFM for different types of food substances Addresses future uses and perspectives of AFM for the development of food nanotechnology
| Author | : S. Morita |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 448 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 3642560199 |
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
| Author | : Arturo M. Baró |
| Publisher | : John Wiley & Sons |
| Total Pages | : 385 |
| Release | : 2012-08-01 |
| Genre | : Science |
| ISBN | : 3527649824 |
About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
