Atomic Force Microscopy And Its Applications
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| Author | : Greg Haugstad |
| Publisher | : John Wiley & Sons |
| Total Pages | : 496 |
| Release | : 2012-09-24 |
| Genre | : Science |
| ISBN | : 0470638826 |
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”
| Author | : Tomasz Tański |
| Publisher | : BoD – Books on Demand |
| Total Pages | : 116 |
| Release | : 2019-01-30 |
| Genre | : Science |
| ISBN | : 1789851696 |
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
| Author | : Pier Carlo Braga |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 388 |
| Release | : 2008-02-02 |
| Genre | : Science |
| ISBN | : 1592596479 |
The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).
| Author | : Arturo M. Baró |
| Publisher | : John Wiley & Sons |
| Total Pages | : 385 |
| Release | : 2012-05-14 |
| Genre | : Science |
| ISBN | : 3527327584 |
About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
| Author | : Mario Lanza |
| Publisher | : John Wiley & Sons |
| Total Pages | : 382 |
| Release | : 2017-12-04 |
| Genre | : Science |
| ISBN | : 3527340912 |
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
| Author | : Peter Eaton |
| Publisher | : Oxford University Press |
| Total Pages | : 257 |
| Release | : 2010-03-25 |
| Genre | : Science |
| ISBN | : 0199570450 |
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
| Author | : Donald O. Thompson |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 2393 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1461528488 |
These Proceedings, consisting of Parts A and B, contain the edited versions of most of the papers presented at the annual Review of Progress in Quantitative Nondestructive Evaluation held at the University of California San Diego, in La Jolla, California on July 19- July 24, 1992. The Review was organized by the Center for NDE at Iowa State University and the Ames Laboratory of the USDOE in cooperation with a number of organizations including the Air Force Wright Laboratory Materials Directorate, the American Society for Nondestructive Testing, the Center for NDE at Johns Hopkins University, the Department of Energy, the Federal Aviation Administration, the National Institute of Standards and Technology, the National Science Foundation IndustrylUniversity Cooperative Research Centers, and the Working Group in Quantitative NDE. This year's Review of Progress in QNDE was attended by approximately 475 participants from the U. S. and many foreign countries who presented over 380 papers. With such a large volume of work to review, the meeting was divided into 36 sessions with as many as four sessions running concurrently. The Review covered all phases of NDE research and development from fundamental investigations to engineering applications or inspection systems, and it included all methods of inspection science from acoustics to x-rays. During the last twenty years, the participants of the Review have contributed to its steady growth. Thanks to their efforts, the Review is today one of the largest and most significant gatherings of NDE researchers and engineers anywhere in the world.
| Author | : W. Richard Bowen |
| Publisher | : Butterworth-Heinemann |
| Total Pages | : 300 |
| Release | : 2009-06-30 |
| Genre | : Technology & Engineering |
| ISBN | : 0080949576 |
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. - Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products - The only book dealing with the theory and practical applications of atomic force microscopy in process engineering - Provides best-practice guidance and experience on using AFM for process and product improvement
| Author | : Bert Voigtländer |
| Publisher | : Springer |
| Total Pages | : 329 |
| Release | : 2019-05-23 |
| Genre | : Science |
| ISBN | : 303013654X |
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
| Author | : S. Morita |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 468 |
| Release | : 2002-07-24 |
| Genre | : Mathematics |
| ISBN | : 9783540431176 |
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
