Atom Probe Tomography
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| Author | : Williams Lefebvre |
| Publisher | : Academic Press |
| Total Pages | : 418 |
| Release | : 2016-05-30 |
| Genre | : Science |
| ISBN | : 0128047453 |
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
| Author | : Michael K. Miller |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 247 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1461542812 |
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
| Author | : Michael K. Miller |
| Publisher | : Springer |
| Total Pages | : 437 |
| Release | : 2014-07-31 |
| Genre | : Technology & Engineering |
| ISBN | : 148997430X |
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
| Author | : Baptiste Gault |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 411 |
| Release | : 2012-08-27 |
| Genre | : Technology & Engineering |
| ISBN | : 146143436X |
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
| Author | : Desmond E. Moser |
| Publisher | : John Wiley & Sons |
| Total Pages | : 347 |
| Release | : 2017-12-26 |
| Genre | : Science |
| ISBN | : 1119227240 |
Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the solar system. First compilation of research focusing on the crystal structure, material properties, and chemical zoning of the geochronology mineral archive down to nanoscale Novel comparisons of mineral time archives from different rocky planets and asteroids and their shock metamorphic histories Fundamentals on how to reconstruct and date radiogenic isotope distributions using atom probe tomography Microstructural Geochronology will be a valuable resource for graduate students, academics, and researchers in the fields of petrology, geochronology, mineralogy, geochemistry, planetary geology, astrobiology, chemistry, and material science. It will also appeal to philosophers and historians of science from other disciplines.
| Author | : Peter W. Hawkes |
| Publisher | : Springer Nature |
| Total Pages | : 1561 |
| Release | : 2019-11-02 |
| Genre | : Technology & Engineering |
| ISBN | : 3030000699 |
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
| Author | : Richard Haight |
| Publisher | : World Scientific |
| Total Pages | : 346 |
| Release | : 2012 |
| Genre | : Science |
| ISBN | : 9814322849 |
As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
| Author | : J Arbiol |
| Publisher | : Elsevier |
| Total Pages | : 573 |
| Release | : 2015-03-31 |
| Genre | : Technology & Engineering |
| ISBN | : 1782422633 |
Semiconductor nanowires promise to provide the building blocks for a new generation of nanoscale electronic and optoelectronic devices. Semiconductor Nanowires: Materials, Synthesis, Characterization and Applications covers advanced materials for nanowires, the growth and synthesis of semiconductor nanowires—including methods such as solution growth, MOVPE, MBE, and self-organization. Characterizing the properties of semiconductor nanowires is covered in chapters describing studies using TEM, SPM, and Raman scattering. Applications of semiconductor nanowires are discussed in chapters focusing on solar cells, battery electrodes, sensors, optoelectronics and biology. - Explores a selection of advanced materials for semiconductor nanowires - Outlines key techniques for the property assessment and characterization of semiconductor nanowires - Covers a broad range of applications across a number of fields
| Author | : Mario Affatigato |
| Publisher | : John Wiley & Sons |
| Total Pages | : 476 |
| Release | : 2015-10-05 |
| Genre | : Technology & Engineering |
| ISBN | : 1118230868 |
The book consists of a series of edited chapters, each written by an expert in the field and focusing on a particular characterization technique as applied to glass. The book covers a variety of techniques ranging from the very common (like Raman and FTIR) to the most recent (and less well known) ones, like SEM for structural analysis and photoelastic measurements. The level of the chapters make it suitable for researchers and for graduate students about to start their research work. It will also: discuss the technique itself, background, nuances when it comes to looking at glassy materials, interpretation of results, case studies, and recent and near-future innovations Fill a widening gap in modern techniques for glass characterization Provide much needed updates on the multiple essential characterization techniques
| Author | : Franz Roters |
| Publisher | : John Wiley & Sons |
| Total Pages | : 188 |
| Release | : 2011-08-04 |
| Genre | : Technology & Engineering |
| ISBN | : 3527642099 |
Written by the leading experts in computational materials science, this handy reference concisely reviews the most important aspects of plasticity modeling: constitutive laws, phase transformations, texture methods, continuum approaches and damage mechanisms. As a result, it provides the knowledge needed to avoid failures in critical systems udner mechanical load. With its various application examples to micro- and macrostructure mechanics, this is an invaluable resource for mechanical engineers as well as for researchers wanting to improve on this method and extend its outreach.
