Applied Crystallography - Proceedings Of The Xvi Conference
Author | : Henryk Morawiec |
Publisher | : World Scientific |
Total Pages | : 502 |
Release | : 1995-05-11 |
Genre | : |
ISBN | : 9814549649 |
This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.