Application Of Molecular Primary Ions For Time Of Flight Secondary Ion Mass Spectrometry Tof Sims Of Organic Surfaces
Download Application Of Molecular Primary Ions For Time Of Flight Secondary Ion Mass Spectrometry Tof Sims Of Organic Surfaces full books in PDF, epub, and Kindle. Read online free Application Of Molecular Primary Ions For Time Of Flight Secondary Ion Mass Spectrometry Tof Sims Of Organic Surfaces ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Secondary Ion Mass Spectrometry
Author | : Fred Stevie |
Publisher | : Momentum Press |
Total Pages | : 233 |
Release | : 2015-09-15 |
Genre | : Technology & Engineering |
ISBN | : 1606505890 |
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
The Practice of TOF-SIMS
Author | : Alan M. Spool |
Publisher | : Momentum Press |
Total Pages | : 267 |
Release | : 2016-03-24 |
Genre | : Technology & Engineering |
ISBN | : 1606507745 |
Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.
ToF-SIMS
Author | : J. C. Vickerman |
Publisher | : IM Publications |
Total Pages | : 742 |
Release | : 2013 |
Genre | : Mass spectrometry |
ISBN | : 1906715173 |
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Author | : Sarah Fearn |
Publisher | : Morgan & Claypool Publishers |
Total Pages | : 67 |
Release | : 2015-10-16 |
Genre | : Technology & Engineering |
ISBN | : 1681740885 |
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
The Handbook of Surface Imaging and Visualization
Author | : Arthur T. Hubbard |
Publisher | : CRC Press |
Total Pages | : 928 |
Release | : 2022-04-13 |
Genre | : Computers |
ISBN | : 100071490X |
This exciting new handbook investigates the characterization of surfaces. It emphasizes experimental techniques for imaging of solid surfaces and theoretical strategies for visualization of surfaces, areas in which rapid progress is currently being made. This comprehensive, unique volume is the ideal reference for researchers needing quick access to the latest developments in the field and an excellent introduction to students who want to acquaint themselves with the behavior of electrons, atoms, molecules, and thin-films at surfaces. It's all here, under one cover! The Handbook of Surface Imaging and Visualization is filled with sixty-four of the most powerful techniques for characterization of surfaces and interfaces in the material sciences, medicine, biology, geology, chemistry, and physics. Each discussion is easy to understand, succinct, yet incredibly informative. Data illustrate present research in each area of study. A wide variety of the latest experimental and theoretical approaches are included with both practical and fundamental objectives in mind. Key references are included for the reader's convenience for locating the most recent and useful work on each topic. Readers are encouraged to contact the authors or consult the references for additional information. This is the best ready reference available today. It is a perfect source book or supplemental text on the subject.
Focus on Surface Science Research
Author | : Charles P. Norris |
Publisher | : Nova Publishers |
Total Pages | : 284 |
Release | : 2006 |
Genre | : Science |
ISBN | : 9781594546327 |
This new book covers the physics and chemistry of surfaces. The scope includes the structure, thermodynamics, and mobility of clean surfaces, as well as the interaction of gas molecules with solid surfaces. The energetic particle interactions that are the basis for the majority of techniques developed to reveal the structure and chemistry of surfaces are explored including auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Crystal nucleation and growth are also considered. Principles such as adsorption, desorption and reactions between adsorbates are examined, with coverage also of new developments in the growth of epitaxial, and Langmuir-Blodgett films, as well as treatment of the etching of surfaces. Modern analytical techniques and applications to thin films and nanostructures are included. The latest in-depth research from around the world is presented.
Secondary Ion Mass Spectroscopy of Solid Surfaces
Author | : V. T. Cherepin |
Publisher | : CRC Press |
Total Pages | : 127 |
Release | : 2020-04-28 |
Genre | : Science |
ISBN | : 1000083136 |
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
Microbeam and Nanobeam Analysis
Author | : Daniele Benoit |
Publisher | : Springer Science & Business Media |
Total Pages | : 628 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 3709165555 |
The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.
Mass Spectrometry Handbook
Author | : Mike S. Lee |
Publisher | : John Wiley & Sons |
Total Pages | : 1362 |
Release | : 2012-04-16 |
Genre | : Science |
ISBN | : 1118180720 |
Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.