Annual Ieee Semiconductor Thermal And Temperature Measurement Symposium 9
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Proceedings of IX Congress. National Group of Mechanical and Thermal Measurements
Author | : Janet Dubbini |
Publisher | : Universitas Studiorum |
Total Pages | : 125 |
Release | : 2014-08-30 |
Genre | : Technology & Engineering |
ISBN | : 8897683681 |
The ninth Congress of the National Mechanical and Thermal Measurement Group took place in Ancona, Italy, on 11- 13 September 2014. The event aims at creating a lively forum where researchers in the field of Mechanical and Thermal Measurements can present their activities and share current results and technical advances. The papers presented at the event deal with a wide range of subject matters related to the congress theme, including: Automated calibration bench, Biomechanics, Blood pressure FEM model, Calibration, Clinical Measurements, Contact pressure human fingers, Contactless temperature measurement, Cross Correlation, Cuff-arm pressure distribution, Cryotherapy, Damage detection, Distance measurement, Equivalent sampling rate, Fast Fourier Transform, Field of View, Fingertip contact pressure, Flow measurements, Focal Length , Force measurement, Frustrated Total Internal Reflection, FTIR, Hand Held Dynamometer, Heat Flux, Hexapod-design, Historical building monitoring, Infrared, PMV measurement, Infrared Thermography, Laser ablation, Laser Ultrasonics , LDA, Low frequency vibrations etc.
1997 IEEE 13th Annual Semiconductor Thermal Measurement & Management Symposium
Author | : Institute of Electrical and Electronics Engineers |
Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages | : 312 |
Release | : 1997 |
Genre | : Technology & Engineering |
ISBN | : |
This volume features coverage of new developments in and applications relating to generation and removal of heat within semiconductor devices, and measurement of junction temperatures under various application and environmental conditions.
Electronic Materials Handbook
Author | : |
Publisher | : ASM International |
Total Pages | : 1234 |
Release | : 1989-11-01 |
Genre | : Technology & Engineering |
ISBN | : 9780871702852 |
Volume 1: Packaging is an authoritative reference source of practical information for the design or process engineer who must make informed day-to-day decisions about the materials and processes of microelectronic packaging. Its 117 articles offer the collective knowledge, wisdom, and judgement of 407 microelectronics packaging experts-authors, co-authors, and reviewers-representing 192 companies, universities, laboratories, and other organizations. This is the inaugural volume of ASMAs all-new ElectronicMaterials Handbook series, designed to be the Metals Handbook of electronics technology. In over 65 years of publishing the Metals Handbook, ASM has developed a unique editorial method of compiling large technical reference books. ASMAs access to leading materials technology experts enables to organize these books on an industry consensus basis. Behind every article. Is an author who is a top expert in its specific subject area. This multi-author approach ensures the best, most timely information throughout. Individually selected panels of 5 and 6 peers review each article for technical accuracy, generic point of view, and completeness.Volumes in the Electronic Materials Handbook series are multidisciplinary, to reflect industry practice applied in integrating multiple technology disciplines necessary to any program in advanced electronics. Volume 1: Packaging focusing on the middle level of the electronics technology size spectrum, offers the greatest practical value to the largest and broadest group of users. Future volumes in the series will address topics on larger (integrated electronic assemblies) and smaller (semiconductor materials and devices) size levels.
Thermal and Power Management of Integrated Circuits
Author | : Arman Vassighi |
Publisher | : Springer Science & Business Media |
Total Pages | : 188 |
Release | : 2006-06-01 |
Genre | : Technology & Engineering |
ISBN | : 0387297499 |
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
National Semiconductor Metrology Program
Author | : National Semiconductor Metrology Program (U.S.) |
Publisher | : |
Total Pages | : 136 |
Release | : |
Genre | : Semiconductors |
ISBN | : |
National Semiconductor Metrology Program
Author | : National Institute of Standards and Technology (U.S.) |
Publisher | : |
Total Pages | : 148 |
Release | : 1999 |
Genre | : Semiconductors |
ISBN | : |
Proceedings of the International Conference on Data Engineering 2015 (DaEng-2015)
Author | : Jemal H. Abawajy |
Publisher | : Springer |
Total Pages | : 624 |
Release | : 2019-08-09 |
Genre | : Technology & Engineering |
ISBN | : 9811317992 |
These proceedings gather outstanding research papers presented at the Second International Conference on Data Engineering 2015 (DaEng-2015) and offer a consolidated overview of the latest developments in databases, information retrieval, data mining and knowledge management. The conference brought together researchers and practitioners from academia and industry to address key challenges in these fields, discuss advanced data engineering concepts and form new collaborations. The topics covered include but are not limited to: • Data engineering • Big data • Data and knowledge visualization • Data management • Data mining and warehousing • Data privacy & security • Database theory • Heterogeneous databases • Knowledge discovery in databases • Mobile, grid and cloud computing • Knowledge management • Parallel and distributed data • Temporal data • Web data, services and information engineering • Decision support systems • E-Business engineering and management • E-commerce and e-learning • Geographical information systems • Information management • Information quality and strategy • Information retrieval, integration and visualization • Information security • Information systems and technologies