Analytical Techniques For The Characterization Of Compound Semiconductors
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| Author | : G. Bastard |
| Publisher | : Elsevier |
| Total Pages | : 554 |
| Release | : 1991-07-26 |
| Genre | : Science |
| ISBN | : 0444596720 |
This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.
| Author | : Gerald Bastard |
| Publisher | : |
| Total Pages | : 0 |
| Release | : 1991 |
| Genre | : Semiconductors |
| ISBN | : 9780444891969 |
| Author | : Gary E. McGuire |
| Publisher | : Momentum Press |
| Total Pages | : 217 |
| Release | : 2010-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1606500430 |
Compound semiconductors such as Gallium Arsenide, Gallium Aluminum Arsenide, and Indium Phosphide are often difficult to characterize and present a variety of challenges from substrate preparation, to epitaxial growth to dielectric film deposition to dopant introduction. This book reviews the common classes of compound semiconductors, their physical, optical and electrical properties and the various types of methods used for characterizing them when analyzing for defects and application problems. The book features: -- Characterization of III-V Thin Films for Electronic and Optical applications -- Characterization of Dielectric Insulating Film layers -- A Special case study on Deep Level Transient Spectroscopy on GaAs -- Concise summaries of major characterization technologies for compound semiconductor materials, including Auger Electron Spectroscopy, Ballistic Electron Emission Microscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis and Raman Spectroscopy
| Author | : |
| Publisher | : |
| Total Pages | : 476 |
| Release | : 1995 |
| Genre | : Measurement |
| ISBN | : |
| Author | : Louise Ferrante |
| Publisher | : CRC Press |
| Total Pages | : 1036 |
| Release | : 1994-11-29 |
| Genre | : Technology & Engineering |
| ISBN | : 1482277611 |
This work discusses techniques for developing new engineering materials such as elastomers, plastic blends, composites, ceramics and high-temperature alloys. Instrumentation for evaluating their properties and identifying potential end uses are presented.;The book is intended for materials, manufacturing, mechanical, chemical and metallurgical engi
| Author | : Richard Haight |
| Publisher | : World Scientific |
| Total Pages | : 346 |
| Release | : 2012 |
| Genre | : Science |
| ISBN | : 9814322849 |
As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
| Author | : Bernd O. Kolbesen |
| Publisher | : The Electrochemical Society |
| Total Pages | : 380 |
| Release | : 1995 |
| Genre | : Technology & Engineering |
| ISBN | : 9781566771221 |
| Author | : Bernd O. Kolbesen |
| Publisher | : The Electrochemical Society |
| Total Pages | : 479 |
| Release | : 2009-09 |
| Genre | : Semiconductors |
| ISBN | : 1566777402 |
The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.
| Author | : Paul H. Holloway |
| Publisher | : Cambridge University Press |
| Total Pages | : 937 |
| Release | : 2008-10-19 |
| Genre | : Technology & Engineering |
| ISBN | : 0080946143 |
This book reviews the recent advances and current technologies used to produce microelectronic and optoelectronic devices from compound semiconductors. It provides a complete overview of the technologies necessary to grow bulk single-crystal substrates, grow hetero-or homoepitaxial films, and process advanced devices such as HBT's, QW diode lasers, etc.
| Author | : Amalia Patane |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 384 |
| Release | : 2012-04-12 |
| Genre | : Technology & Engineering |
| ISBN | : 3642233511 |
The book describes the fundamentals, latest developments and use of key experimental techniques for semiconductor research. It explains the application potential of various analytical methods and discusses the opportunities to apply particular analytical techniques to study novel semiconductor compounds, such as dilute nitride alloys. The emphasis is on the technique rather than on the particular system studied.
