An In Situ High Voltage Electron Microscopy Technique For The Study Of Deformation And Fracture In Multilayered Materials
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| Author | : Renu Sharma |
| Publisher | : |
| Total Pages | : 250 |
| Release | : 1996-08-26 |
| Genre | : Science |
| ISBN | : |
Electron microscopy techniques are among the most powerful methods for characterization of materials, with the ability to reveal both the atomic-scale structure and composition. This information may be used to elucidate macroscopic properties or to optimize materials synthesis and processing. Instrumentation and techniques for dynamic in situ experiments are undergoing rapid development and have recently been applied to a wide range of problems. This book focuses on time-resolved electron microscopy (including diffraction and spectroscopy), as well as novel instrumentation for temperature and pressure control. In addition to discussing the application of electron microscopy techniques to the in situ study of the kinetics, thermodynamics and mechanisms of reaction, the book also explores their utility as efficient methods of optimizing processing conditions. Imaging techniques featured include: scanning tunneling microscopy, high-resolution electron microscopy, dark field transmission and reflection electron microscopy, Lorentz microscopy, electron holography, scanning and low-energy electron microscopy and photoemission electron microscopy
| Author | : Ron M. Anderson |
| Publisher | : |
| Total Pages | : 320 |
| Release | : 1997 |
| Genre | : Science |
| ISBN | : 9781558993846 |
Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This book from MRS, the fourth in a successful series, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the book are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semiconducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.
| Author | : |
| Publisher | : |
| Total Pages | : 572 |
| Release | : 1996 |
| Genre | : Science |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : 1856 |
| Release | : 1997 |
| Genre | : Medicine |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : 602 |
| Release | : 1995 |
| Genre | : Aeronautics |
| ISBN | : |
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
| Author | : Gerhard Dehm |
| Publisher | : John Wiley & Sons |
| Total Pages | : 403 |
| Release | : 2012-05-30 |
| Genre | : Technology & Engineering |
| ISBN | : 3527652183 |
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
| Author | : |
| Publisher | : |
| Total Pages | : 682 |
| Release | : 1999 |
| Genre | : Aeronautics |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : 852 |
| Release | : 1990 |
| Genre | : Power resources |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : 1390 |
| Release | : 1995 |
| Genre | : Metallurgy |
| ISBN | : |
| Author | : Peter W. Hawkes |
| Publisher | : Springer Nature |
| Total Pages | : 1561 |
| Release | : 2019-11-02 |
| Genre | : Technology & Engineering |
| ISBN | : 3030000699 |
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
