Advanced Short-time Thermal Processing for Si-based CMOS Devices 2
Author | : Mehmet C. Öztürk |
Publisher | : The Electrochemical Society |
Total Pages | : 444 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : 9781566774062 |
Download Advanced Short Time Thermal Processing For Si Based Cmos Devices 2 full books in PDF, epub, and Kindle. Read online free Advanced Short Time Thermal Processing For Si Based Cmos Devices 2 ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author | : Mehmet C. Öztürk |
Publisher | : The Electrochemical Society |
Total Pages | : 444 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : 9781566774062 |
Author | : Fred Roozeboom |
Publisher | : The Electrochemical Society |
Total Pages | : 488 |
Release | : 2003 |
Genre | : Computers |
ISBN | : 9781566773966 |
Author | : Fred Roozeboom |
Publisher | : The Electrochemical Society |
Total Pages | : 472 |
Release | : 2006 |
Genre | : Gate array circuits |
ISBN | : 1566775027 |
These proceedings describe processing, materials, and equipment for CMOS front-end integration including gate stack, source/drain and channel engineering. Topics: strained Si/SiGe and Si/SiGe on insulator; high-mobility channels including III-V¿s, etc.; nanowires and carbon nanotubes; high-k dielectrics, metal and FUSI gate electrodes; doping/annealing for ultra-shallow junctions; low-resistivity contacts; advanced deposition (e.g. ALD, CVD, MBE), RTP, UV, plasma and laser-assisted processes.
Author | : Samares Kar |
Publisher | : The Electrochemical Society |
Total Pages | : 512 |
Release | : 2004 |
Genre | : Science |
ISBN | : 9781566774055 |
"This volume is the proceedings of The Second International Symposium on High Dielectric Constant Materials: Materials Science, Processing, Reliability, and Manufacturing Issues ... and was held during [the] 204th Meeting [of the Electrochemical Society] ..."--P. v.
Author | : Dim-Lee Kwong |
Publisher | : The Electrochemical Society |
Total Pages | : 458 |
Release | : 2001 |
Genre | : Technology & Engineering |
ISBN | : 9781566773157 |
"Electronics, Dielectric Science and Technology, and High Temperature Materials Divisions."
Author | : Yoshio Nishi |
Publisher | : CRC Press |
Total Pages | : 3276 |
Release | : 2017-12-19 |
Genre | : Technology & Engineering |
ISBN | : 1351829823 |
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Author | : Samares Kar |
Publisher | : The Electrochemical Society |
Total Pages | : 565 |
Release | : 2006 |
Genre | : Dielectrics |
ISBN | : 1566775035 |
This issue covers, in detail, all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high dielectric constant materials, processing, metals for gate electrodes, interfaces, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.