Advanced Optical Data Storage

Advanced Optical Data Storage
Author: Society of Photo-optical Instrumentation Engineers
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 296
Release: 1999
Genre: Computers
ISBN:

Optical Data Storage

Optical Data Storage
Author: Erwin R. Meinders
Publisher: Springer Science & Business Media
Total Pages: 181
Release: 2006-11-15
Genre: Technology & Engineering
ISBN: 1402042175

This is an overview of recording principles, materials aspects, and applications of rewritable optical storage. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability are explained and extensively discussed. Throughout the book, a mark formation model is described and used to back-up measurement results and support the discussed applications. High-speed and dual-layer recording are analyzed in depth, with proposals to achieve higher performance.

Phase Change Memory

Phase Change Memory
Author: Moinuddin Khalil Ahmed Qureshi
Publisher: Morgan & Claypool Publishers
Total Pages: 137
Release: 2012
Genre: Computers
ISBN: 160845665X

As conventional memory technologies such as DRAM and Flash run into scaling challenges, architects and system designers are forced to look at alternative technologies for building future computer systems. This synthesis lecture begins by listing the requirements for a next generation memory technology and briefly surveying the landscape of novel non-volatile memories. Among these, Phase Change Memory (PCM) is emerging as a leading contender, and the authors discuss the material, device, and circuit advances underlying this exciting technology. The lecture then describes architectural solutions to enable PCM for main memories. Finally, the authors explore the impact of such byte-addressable non-volatile memories on future storage and system designs. Table of Contents: Next Generation Memory Technologies / Architecting PCM for Main Memories / Tolerating Slow Writes in PCM / Wear Leveling for Durability / Wear Leveling Under Adversarial Settings / Error Resilience in Phase Change Memories / Storage and System Design With Emerging Non-Volatile Memories