Advanced Metrology
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Author | : X. Jane Jiang |
Publisher | : Academic Press |
Total Pages | : 376 |
Release | : 2020-04-08 |
Genre | : Technology & Engineering |
ISBN | : 0128218169 |
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software
Author | : Alistair B Forbes |
Publisher | : World Scientific |
Total Pages | : 460 |
Release | : 2018-10-16 |
Genre | : Mathematics |
ISBN | : 981327431X |
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
Author | : Wolfgang Osten |
Publisher | : John Wiley & Sons |
Total Pages | : 471 |
Release | : 2012-09-10 |
Genre | : Science |
ISBN | : 3527648461 |
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Author | : Nicola Bellomo |
Publisher | : World Scientific |
Total Pages | : 290 |
Release | : 1994-05-18 |
Genre | : |
ISBN | : 9814550957 |
This volume will interest researchers and others involved with high-precision measurements and the development of mathematical tools for this purpose. Advances in metrology depend on improvements in scientific and technical knowledge, the quality of instruments, a better use of advanced mathematical tools and the development of new ones.A tradition of close cooperation between metrologists and mathematicians, while found elsewhere, is lacking in Italy. This workshop wishes to start such a cooperation by providing a common meeting ground. Several industrial sectors, particularly those of instrumentation and software, are likely to benefit from this process, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming increasingly important in industrial processes.
Author | : Franco Pavese |
Publisher | : World Scientific |
Total Pages | : 419 |
Release | : 2009-04-15 |
Genre | : Mathematics |
ISBN | : 9814468517 |
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields.This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author | : Franco Pavese |
Publisher | : World Scientific |
Total Pages | : 419 |
Release | : 2009 |
Genre | : Mathematics |
ISBN | : 9812839518 |
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author | : Franco Pavese |
Publisher | : World Scientific |
Total Pages | : 419 |
Release | : 2009 |
Genre | : Technology & Engineering |
ISBN | : 9812839526 |
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author | : Yosi Shacham-Diamand |
Publisher | : Springer Science & Business Media |
Total Pages | : 545 |
Release | : 2009-09-19 |
Genre | : Science |
ISBN | : 0387958681 |
In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation of modern electronics system create a strong demand for new and improved electronic circuits as demonstrated by the amazing progress in the ?eld of ULSI technology. This progress is well described by the famous “Moore’s law” which states, in its most general form, that all the metrics that describe integrated circuit performance (e. g. , speed, number of devices, chip area) improve expon- tially as a function of time. For example, the number of components per chip d- bles every 18 months and the critical dimension on a chip has shrunk by 50% every 2 years on average in the last 30 years. This rapid growth in integrated circuits te- nology results in highly complex integrated circuits with an increasing number of interconnects on chips and between the chip and its package. The complexity of the interconnect network on chips involves an increasing number of metal lines per interconnect level, more interconnect levels, and at the same time a reduction in the interconnect line critical dimensions.
Author | : Salah H. R. Ali |
Publisher | : CRC Press |
Total Pages | : 225 |
Release | : 2017-07-06 |
Genre | : Science |
ISBN | : 1315341190 |
In recent decades, metrology—an accurate and precise technology of high quality for automotive engines—has garnered a great deal of scientific interest due to its unique advanced soft engineering techniques in design and diagnostics. Used in a variety of scientific applications, these techniques are now widely regarded as safer, more efficient, and more effective than traditional ones. This book compiles and details the cutting-edge research in science and engineering from the Egyptian Metrology Institute (National Institute for Standards) that is revolutionizing advanced dimensional techniques through the development of coordinate and surface metrology.
Author | : Franco Pavese |
Publisher | : World Scientific |
Total Pages | : 546 |
Release | : 2022-01-13 |
Genre | : Mathematics |
ISBN | : 9811242399 |
This volume contains original, refereed contributions by researchers from national metrology institutes, universities and laboratories across the world involved in metrology and testing. The volume has been produced by the International Measurement Confederation Technical Committee 21, Mathematical Tools for Measurements and is the twelfth in the series. The papers cover topics in numerical analysis and computational tools, statistical inference, regression, calibration and metrological traceability, computer science and data provenance, and describe applications in a wide range of application domains. This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. It will also be of interest to scientists and engineers concerned with the reliability, trustworthiness and reproducibility of data and data analytics in data-driven systems in engineering, environmental and life sciences.