A Theory Of 1 F Noise In Thin Metal Films
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Author | : G.P. Zhigal'skii |
Publisher | : CRC Press |
Total Pages | : 234 |
Release | : 2003-07-10 |
Genre | : Technology & Engineering |
ISBN | : 9781420024074 |
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Author | : |
Publisher | : |
Total Pages | : 702 |
Release | : 1995 |
Genre | : Aeronautics |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 720 |
Release | : 1997 |
Genre | : Physics |
ISBN | : |
Author | : D. Wolf |
Publisher | : Springer Science & Business Media |
Total Pages | : 344 |
Release | : 2013-12-11 |
Genre | : Science |
ISBN | : 3642876404 |
Noise in physical systems - as a consequence of the corpuscular nature of matter - conveys information about microscopic mechanisms determining the macroscopic behavior of the system. Besides being a source of information, noise also represents a source of annoying disturbances which affect information transMission along a physical system. Therefore, noise analysis can promote our insight into the behavior of a physical system, as well as our knowledge of the natural constraints imposed upon physical-information transmission channels and devices. In recent years the continuous scientific and technical interest in noise problems has led to a remarkable progress in the understanding of noise phenomena. This progress is reflected by the rich material presented at the Fifth International Conference on Noise in Physical Systems. The conference papers originally published in these proceedings cover the various aspects of today's noise research in the fields of solid-state devices, l/f-noise, magnetic and superconducting materials, measuring methods, and theory of fluctuations. Each session of the conference was introduced by one or two invited review lectures which are included in these proceedings in full length. The 12 invited papers and more than 40 contributed papers on specific topics (only three of them have been omitted from the proceedings since they will be published elsewhere) provide a comprehensive survey of the current state-of-the-art and recent advances of noise analysis.
Author | : Tibor Grasser |
Publisher | : Springer Nature |
Total Pages | : 724 |
Release | : 2020-04-26 |
Genre | : Technology & Engineering |
ISBN | : 3030375005 |
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
Author | : United States. Energy Research and Development Administration. Division of Physical Research |
Publisher | : |
Total Pages | : 128 |
Release | : 1975 |
Genre | : Conservation of natural resources |
ISBN | : |
Author | : Albert Van der Ziel |
Publisher | : Wiley-Interscience |
Total Pages | : 328 |
Release | : 1986-05-13 |
Genre | : Technology & Engineering |
ISBN | : |
Gives basic and up-to-date information about noise sources in electronic devices. Demonstrates how this information can be used to calculate the noise performance, in particular the noise figure, of electronic circuits using these devices. Optimization procedures, both for the circuits and for the devices, are then devised based on these data. Gives an elementary treatment of thermal noise, diffusion noise, and velocity-fluctuation noise, including quantum effects in thermal noise and maser noise.
Author | : Michael Shur |
Publisher | : World Scientific |
Total Pages | : 310 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : 9789812562364 |
The unique materials properties of GaN-based semiconductors havestimulated a great deal of interest in research and developmentregarding nitride materials growth and optoelectronic andnitride-based electronic devices. High electron mobility andsaturation velocity, high sheet carrier concentration atheterojunction interfaces, high breakdown field, and low thermalimpedance of GaN-based films grown over SiC or bulk AlN substratesmake nitride-based electronic devices very promising.
Author | : Martin Dressel |
Publisher | : MDPI |
Total Pages | : 345 |
Release | : 2018-10-04 |
Genre | : Science |
ISBN | : 3038971804 |
This book is a printed edition of the Special Issue "Advances in Organic Conductors and Superconductors" that was published in Crystals
Author | : United States. Department of Energy. Office of Basic Energy Sciences |
Publisher | : |
Total Pages | : 166 |
Release | : 1978 |
Genre | : Conservation of natural resources |
ISBN | : |