Modelling Foundations and Applications

Modelling Foundations and Applications
Author: Alfonso Pierantonio
Publisher: Springer
Total Pages: 325
Release: 2018-06-18
Genre: Computers
ISBN: 3319929976

This book constitutes the proceedings of the 14th European Conference on Modelling Foundations and Applications, ECMFA 2018, held as part of STAF 2018, in Toulouse, France, in June 2018. The 19 papers presented in this volume were carefully reviewed and selected from 45 submissions. The cover topics such as (bidirectional and unidirectional) model transformations, model management, re-engineering, modelling environments, verification and validation, and domain-specific modelling w.r.t. business processes, automotive software, and safety-critical software.

Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )

Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )
Author: Barry N. Taylor
Publisher: DIANE Publishing
Total Pages: 25
Release: 2009-11
Genre: Science
ISBN: 1437915566

Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.

Measurement Uncertainty

Measurement Uncertainty
Author: Simona Salicone
Publisher: Springer Science & Business Media
Total Pages: 235
Release: 2007-06-04
Genre: Mathematics
ISBN: 0387463283

The expression of uncertainty in measurement poses a challenge since it involves physical, mathematical, and philosophical issues. This problem is intensified by the limitations of the probabilistic approach used by the current standard (the GUM Instrumentation Standard). This text presents an alternative approach. It makes full use of the mathematical theory of evidence to express the uncertainty in measurements. Coverage provides an overview of the current standard, then pinpoints and constructively resolves its limitations. Numerous examples throughout help explain the book’s unique approach.

An Introduction to Measurement Uncertainty

An Introduction to Measurement Uncertainty
Author: Blair D Hall
Publisher:
Total Pages:
Release: 2020
Genre: Measurement uncertainty (Statistics)
ISBN: 9780473405823

"This introduction to measurement uncertainty is intended for metrology professionals working in calibration laboratories and metrology institutes, as well as students in tertiary-level science and engineering programmes. The subject matter is presented with an emphasis on developing models of the physical measurement process. The level of mathematics and statistics used is basic and is typically covered by high school studies"--Distributor's website.

Transverse Disciplines in Metrology

Transverse Disciplines in Metrology
Author: French College of Metrology
Publisher: John Wiley & Sons
Total Pages: 634
Release: 2013-05-10
Genre: Technology & Engineering
ISBN: 111862341X

Based on The International Metrology Congress meeting, this reference examines the evolution of metrology, and its applications in industry, environment and safety, health and medicine, economy and quality, and new information and communication technologies; details the improvement of measurement procedures to guarantee the quality of products and processes; and discusses the development of metrology linked to innovating technologies. The themes of the Congress (quality and reliability of measurement, measurement uncertainties, calibration, verification, accreditation, sensory metrology, regulations and legal metrology) are developed either in a general way or applied to a specific economic sector or to a specific scientific field.

Machine Tool Metrology

Machine Tool Metrology
Author: Graham T. Smith
Publisher: Springer
Total Pages: 700
Release: 2016-04-06
Genre: Technology & Engineering
ISBN: 3319251090

Maximizing reader insights into the key scientific disciplines of Machine Tool Metrology, this text will prove useful for the industrial-practitioner and those interested in the operation of machine tools. Within this current level of industrial-content, this book incorporates significant usage of the existing published literature and valid information obtained from a wide-spectrum of manufacturers of plant, equipment and instrumentation before putting forward novel ideas and methodologies. Providing easy to understand bullet points and lucid descriptions of metrological and calibration subjects, this book aids reader understanding of the topics discussed whilst adding a voluminous-amount of footnotes utilised throughout all of the chapters, which adds some additional detail to the subject. Featuring an extensive amount of photographic-support, this book will serve as a key reference text for all those involved in the field.

Data Modeling for Metrology and Testing in Measurement Science

Data Modeling for Metrology and Testing in Measurement Science
Author: Franco Pavese
Publisher: Springer Science & Business Media
Total Pages: 499
Release: 2008-12-16
Genre: Mathematics
ISBN: 0817648046

This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.

Vector Network Analyzer (VNA) Measurements and Uncertainty Assessment

Vector Network Analyzer (VNA) Measurements and Uncertainty Assessment
Author: Nosherwan Shoaib
Publisher: Springer
Total Pages: 91
Release: 2016-09-22
Genre: Technology & Engineering
ISBN: 3319447726

This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes a fully analytical approach to measurement uncertainty evaluation, while also highlighting the interaction and the linear propagation of different uncertainty sources to compute the final uncertainties associated with the measurements. The book subsequently discusses the dimensional characterization of waveguide standards and the quality of the vector network analyzer (VNA) calibration techniques. The book concludes with an in-depth description of the novel verification artefacts used to assess the performance of the VNAs. It offers a comprehensive reference guide for beginners to experts, in both academia and industry, whose work involves the field of network analysis, instrumentation and measurements.

Introduction to Statistics in Metrology

Introduction to Statistics in Metrology
Author: Stephen Crowder
Publisher: Springer Nature
Total Pages: 357
Release: 2020-11-30
Genre: Mathematics
ISBN: 3030533298

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.