Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports
Author:
Publisher:
Total Pages: 666
Release: 1988
Genre: Aeronautics
ISBN:

Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

A Fault Injection Experiment Using the Airlab Diagnostic Emulation Facility

A Fault Injection Experiment Using the Airlab Diagnostic Emulation Facility
Author: National Aeronautics and Space Administration (NASA)
Publisher: Createspace Independent Publishing Platform
Total Pages: 130
Release: 2018-07-17
Genre:
ISBN: 9781722896591

The preparation for, conduct of, and results of a simulation based fault injection experiment conducted using the AIRLAB Diagnostic Emulation facilities is described. An objective of this experiment was to determine the effectiveness of the diagnostic self-test sequences used to uncover latent faults in a logic network providing the key fault tolerance features for a flight control computer. Another objective was to develop methods, tools, and techniques for conducting the experiment. More than 1600 faults were injected into a logic gate level model of the Data Communicator/Interstage (C/I). For each fault injected, diagnostic self-test sequences consisting of over 300 test vectors were supplied to the C/I model as inputs. For each test vector within a test sequence, the outputs from the C/I model were compared to the outputs of a fault free C/I. If the outputs differed, the fault was considered detectable for the given test vector. These results were then analyzed to determine the effectiveness of some test sequences. The results established coverage of selt-test diagnostics, identified areas in the C/I logic where the tests did not locate faults, and suggest fault latency reduction opportunities. Baker, Robert and Mangum, Scott and Scheper, Charlotte Unspecified Center COMPUTERIZED SIMULATION; FAULT TOLERANCE; FLIGHT CONTROL; LOGIC CIRCUITS; RELIABILITY ANALYSIS; COMPUTER NETWORKS; DIAGNOSIS; DIGITAL SYSTEMS; SYSTEM EFFECTIVENESS...