1 F Noise And Electromigration In A1 Ti Thin Films
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Effect of Electromigration of 1/f Noise of Thin Film Conductor
Author | : Tuck Pao Djeu |
Publisher | : |
Total Pages | : 130 |
Release | : 1984 |
Genre | : Electronic circuits |
ISBN | : |
Excess Noise and Its Relationship to Electromigration in Thin Film Interconnections
Author | : James G. Cottle |
Publisher | : |
Total Pages | : 348 |
Release | : 1986 |
Genre | : Aluminum films |
ISBN | : |
A Theory of 1/F Noise in Thin Metal Films
Author | : Igor S. Pavlin |
Publisher | : |
Total Pages | : 218 |
Release | : 1981 |
Genre | : Electric noise |
ISBN | : |
On the 1/f Noise of Atomic-layer-deposition Metal Films
Author | : Xiawa Wang |
Publisher | : |
Total Pages | : 81 |
Release | : 2011 |
Genre | : |
ISBN | : |
This thesis presents the measurement techniques and results of low-frequency noise for atomic-layer-deposition Pt films. Atomic-layer-deposition has been developed as an approach to make ultra-thin and conformal films. It has been employed to make detectors of bolometers. 1/f noise is a fundamental limit to the resolution. The experiments are designed to characterize the 1/f noise of the ALD fabricated Pt films. The measurement results show that for 7nm and 13nm ALD fabricated Pt films, 1/f noise is about two orders of magnitude larger than reported for continuous Pt films in literature. The thin film is also very likely to suffer from electromigration damage.
Masters Theses in the Pure and Applied Sciences
Author | : Wade H. Shafer |
Publisher | : Springer Science & Business Media |
Total Pages | : 386 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 1461573912 |
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thougtit that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volumes were handled by an interna tional publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 31 (thesis year 1986) a total of 11 ,480 theses titles trom 24 Canadian and 182 United States universities. We are sure that this broader base tor these titles reported will greatly enhance the value ot this important annual reterence work. While Volume 31 reports theses submitted in 1986, on occasion, certain univer sities do re port theses submitted in previousyears but not reported at the time.
Reliability of Compound Analogue Semiconductor Integrated Circuits
Author | : Aris Christou |
Publisher | : RIAC |
Total Pages | : 487 |
Release | : 2006 |
Genre | : |
ISBN | : 1933904194 |
Scientific and Technical Aerospace Reports
Author | : |
Publisher | : |
Total Pages | : |
Release | : 1987 |
Genre | : Aeronautics |
ISBN | : |
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.